Longitudinal and transverse spatial beam profile measurement of relativistic electron bunch by electro-optic sampling

被引：28

作者：

Ota, Masato ^{[1
]}

Kan, Koichi ^{[2
]}

Komada, Soichiro ^{[3
]}

Arikawa, Yasunobu ^{[1
]}

Shimizu, Tomoki ^{[1
]}

Mag-usara, Valynn Katrine ^{[1
]}

Sakawa, Youichi ^{[1
]}

Matsui, Tatsunosuke ^{[3
]}

Nakajima, Makoto ^{[1
]}

机构：

[1] Osaka Univ, Inst Laser Engn, Suita, Osaka 5650871, Japan

[2] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 5670047, Japan

[3] Mie Univ, Dept Elect & Elect Engn, Tsu, Mie 5148507, Japan

来源：

APPLIED PHYSICS EXPRESS | 2021年 / 14卷 / 02期

关键词：

Electro-optic sampling; Electron beam; X-ray free-electron laser; Laser plasma acceleration; LASER;

D O I：

10.35848/1882-0786/abd867

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Electro-optic (EO) sampling is employed to measure the electric field profiles generated by a relativistic electron bunch along the propagation and in the radial directions. The longitudinal (temporal) profile is investigated by changing the time delay between the electron bunch and the pulsed probe laser, while the transverse (radial) profile is acquired by laterally shifting the path of the electron bunch. Experimental results show good agreement with three-dimensional particle-in-cell calculations. We demonstrated a promising method to simultaneously obtain the longitudinal and transverse beam sizes by utilizing the detected spatio-temporal electric field distribution around the electron bunch.

引用

页数：5

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