Reduction of Charge Traps and Stability Enhancement in Solution-Processed Organic Field-Effect Transistors Based on a Blended n-Type Semiconductor

被引:60
作者
Campos, Antonio [1 ,2 ]
Riera-Galindo, Sergi [1 ,2 ]
Puigdollers, Joaquim [3 ]
Mas-Torrent, Marta [1 ,2 ]
机构
[1] Inst Ciencia Mat Barcelona ICMAB CSIC, Campus UAB, Barcelona 08193, Spain
[2] Networking Res Ctr Bioengn Biomat & Nanomed CIBER, Campus UAB, Barcelona 08193, Spain
[3] Univ Politecn Cataluna, Dept Engn Elect, Jordi Girona 1-3, ES-08034 Barcelona, Spain
基金
欧洲研究理事会;
关键词
n-type; OFET; high stability; semiconductor-dielectric interface; density-of-states; THIN-FILM TRANSISTORS; VERTICAL PHASE-SEPARATION; CARRIER TRANSPORT; HIGH-PERFORMANCE; ELECTRON; PACKING; DESIGN; HOLE;
D O I
10.1021/acsami.8b02851
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Solution-processed n-type organic field-effect transistors (OFETs) are essential elements for developing large-area, low-cost, and all organic logic/complementary circuits. Nonetheless, the development of air-stable n-type organic semiconductors (OSCs) lags behind their p-type counterparts. The trapping of electrons at the semiconductor dielectric interface leads to a lower performance and operational stability. Herein, we report printed small-molecule n-type OFETs based on a blend with a binder polymer, which enhances the device stability due to the improvement of the semiconductor dielectric interface quality and a self-encapsulation. Both combined effects prevent the fast deterioration of the OSC. Additionally, a complementary metal-oxide semiconductor-like inverter is fabricated depositing p-type and n-type OSCs simultaneously.
引用
收藏
页码:15952 / 15961
页数:10
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