Restoration of scanning tunneling microscope images by means of two-dimensional maximum entropy method

被引:1
|
作者
Matsumoto, H
Tokiwano, K
Hosoi, H
Sueoka, K
Mukasa, K
机构
[1] Hokkaido Univ, Grad Sch Engn, Kita Ku, Sapporo, Hokkaido 0608628, Japan
[2] Hokkaido Univ, CAST, Kita Ku, Sapporo, Hokkaido 0600830, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 5A期
关键词
scanning tunneling microscopy; noise; restoration; two-dimensional analysis; maximum entropy method; power spectral density; nonlinear least squares method; image processing;
D O I
10.1143/JJAP.41.3092
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present a new technique for the restoration of scanning tunneling microscopy (STM) images, which is a two-dimensional extension of a recently developed statistical approach based on the one-dimensional least-squares method (LSM). An STM image is regarded as a realization of a stochastic process and assumed to be a composition of an underlying image and noise. We express the underlying image in terms of a two-dimensional generalized trigonometric polynomial suitable for representing the atomic protrusions in STM images. The optimization of the polynomial is performed by the two-dimensional LSM combined with the power spectral density function estimated by means of the maximum entropy method (MEM) iterative algorithm for two-dimensional signals. The restored images are obtained as the optimum least-squares fitting polynomial which is a continuous surface. We apply this technique to modeled and actual STM data. Results show that the present method yields a reasonable restoration of STM images.
引用
收藏
页码:3092 / 3098
页数:7
相关论文
共 50 条
  • [1] Restoration of scanning tunneling microscope images by means of two-dimensional maximum entropy method
    Matsumoto, Hisanori
    Tokiwano, Kazuo
    Hosoi, Hirotaka
    Sueoka, Kazuhisa
    Mukasa, Koichi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2002, 41 (5 A): : 3092 - 3098
  • [3] Scanning tunneling microscope with two-dimensional translator
    Nichols, J.
    Ng, K. -W.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (01):
  • [4] Two-dimensional positioner for a scanning tunneling microscope
    Baiburin, VB
    Volkov, YP
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1996, 39 (05) : 741 - 742
  • [5] TWO-DIMENSIONAL, REMOTE MICROPOSITIONER FOR A SCANNING TUNNELING MICROSCOPE
    MAMIN, HJ
    ABRAHAM, DW
    GANZ, E
    CLARKE, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (11): : 2168 - 2170
  • [6] Restoration of images obtained from the scanning tunneling microscope
    Tsuchida, M
    Tokiwano, K
    Hosoi, H
    Sueoka, K
    Ohtomo, N
    Tanaka, Y
    Mukasa, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (6A): : 3500 - 3505
  • [7] RESTORATION OF IMAGES FROM THE SCANNING-TUNNELING MICROSCOPE
    KOKARAM, AC
    PERSAD, N
    LASENBY, J
    FITZGERALD, WJ
    MCKINNON, A
    WELLAND, M
    APPLIED OPTICS, 1995, 34 (23): : 5121 - 5132
  • [8] Boundary integral equations for a two-dimensional simulator of a photon scanning tunneling microscope
    Tanaka, K
    Tanaka, M
    Omoya, T
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1998, 15 (07): : 1918 - 1931
  • [9] Two-dimensional ordering of octadecanethiol molecules on graphite observed by scanning tunneling microscope
    Sheng, H.Y.
    Fujita, D.
    Ohgi, T.
    Dong, Z.C.
    Jiang, Q.D.
    Nejoh, H.
    Applied Surface Science, 1997, 121-122 : 129 - 132
  • [10] Scanning Tunneling Microscope-Induced Excitonic Luminescence of a Two-Dimensional Semiconductor
    Pommier, Delphine
    Bretel, Remi
    Lopez, Luis E. Parra
    Fabre, Florentin
    Mayne, Andrew
    Boer-Duchemin, Elizabeth
    Dujardin, Gerald
    Schull, Guillaume
    Berciaud, Stephane
    Le Moal, Eric
    PHYSICAL REVIEW LETTERS, 2019, 123 (02)