Evolution of surface structures on Si(001) during hydrogen desorption

被引:6
作者
Yoshimura, M
Ueda, K
机构
[1] Toyota Technology Institute, Nagoya 468, 2-12-1 Hisakata, Tempaku-ku
关键词
scanning tunneling microscopy; etching; silicon; hydrogen; surface defects; surface diffusion;
D O I
10.1016/S0169-4332(97)00283-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have examined atomistic processes of hydrogen desorption from the H/Si(001) surface by scanning tunneling microscopy (STM). At a low hydrogen dose, Si atoms are etched from the surface and the patched pattern of 2 x 1 and 1 x 2, where each step edge penetrates into neighboring steps, is observed. On the other hand, a quasi-stable c(4 x 4) surface reconstruction is observed for high doses of hydrogen before the complete recovery of the 2 x 1 structure. It is found that the formation of the c(4 x 4) structure needs a rather large density of vacancies and that the domains are pinned at the clusters and disordered areas on the surface. (C) 1997 Elsevier Science B.V.
引用
收藏
页码:179 / 182
页数:4
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