Gas source molecular-beam epitaxy growth of GaN/GaP superlattices and GaN layers on GaP(111)A substrates

被引:1
|
作者
Ohnishi, K [1 ]
Tampo, H [1 ]
Imanishi, Y [1 ]
Yamada, K [1 ]
Asami, K [1 ]
Asahi, H [1 ]
机构
[1] Osaka Univ, Inst Sci & Ind Res, Ibaraki 5670047, Japan
基金
日本学术振兴会;
关键词
molecular beam epitaxy; nitrides; semiconducting III-V materials;
D O I
10.1016/S0022-0248(02)01524-5
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
GaN/GaP short-period superlattices were grown on GaP(111)A substrates by gas source molecular-beam epitaxy. Despite the large lattice-mismatch between GaN and GaP, reflection high-energy electron diffraction patterns showed the quick switch from GaN (GaP) streaks to GaP (GaN) streaks just after the corresponding switch of the growth. This indicates two-dimensional layer-by-layer growth resulting from the relaxation of lattice strain at the initial stage of the hetero-epitaxy. This phenomenon is considered to be due to the use of (111)A-oriented substrates. Bulk GaN layers were also grown on GaP(111)A substrates and the flat-surface GaN layers were obtained because of the two-dimensional layer-by-layer growth starting from the interface between GaN and GaP (111)A substrates. Strong near-band-edge photoluminescence with very weak deep-level emission was observed. GaP(111)A substrate is considered to be promising for the growth of GaN. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:283 / 287
页数:5
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