Diffuse reflectance measurement using gas absorption spectroscopy

被引：4

作者：

Gao, Qiang ^{[1
]}

Yu, Jia ^{[1
]}

Zhang, Yungang ^{[1
]}

Zhang, Zhiguo ^{[1
]}

Cao, Wenwu ^{[1
,2
]}

机构：

[1] Harbin Inst Technol, Condensed Matter Sci & Technol Inst, Harbin 150080, Peoples R China

[2] Penn State Univ, Mat Res Inst, University Pk, PA 16802 USA

来源：

SENSORS AND ACTUATORS B-CHEMICAL | 2014年 / 196卷

基金：

中国博士后科学基金;

关键词：

Diffuse reflectance; Diode laser; Gas absorption spectroscopy; Integrating sphere; INTEGRATING-SPHERE;

D O I：

10.1016/j.snb.2014.02.010

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A precise method for the measurement of diffuse reflectance by using gas absorption spectroscopy technique with an integrating sphere is demonstrated. A quantitative relationship between the diffuse reflectance and the gas absorption spectrum is formulated, which has been further validated by experiments. The precision of the reflectivity measurement depends on the diameter and port fraction of the integrating sphere as well as gas concentration, and it increases linearly with the magnitude of the reflectivity. A high precision of 0.005% was achieved at the reflectivity of 0.98844(5). (C) 2014 Elsevier B.V. All rights reserved.

引用

页码：147 / 150

页数：4

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