Reconstruction of in-line digital holograms from two intensity measurements

被引:93
作者
Zhang, Y
Pedrini, G
Osten, W
Tiziani, HJ
机构
[1] Capital Normal Univ, Dept Phys, Beijing 100037, Peoples R China
[2] Univ Stuttgart, Inst Tech Opt, D-70569 Stuttgart, Germany
关键词
D O I
10.1364/OL.29.001787
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We propose a new method based on in-line digital holography for the reconstruction of a wave front from only two intensity recordings. The simulation result shows that this method works well when the object wave is weak compared with the reference wave. This technique can be employed for real-time imaging. (C) 2004 Optical Society of America.
引用
收藏
页码:1787 / 1789
页数:3
相关论文
共 12 条
[1]  
[Anonymous], 1980, METHODS DIGITAL HOLO
[2]   Digital holography for quantitative phase-contrast imaging [J].
Cuche, E ;
Bevilacqua, F ;
Depeursinge, C .
OPTICS LETTERS, 1999, 24 (05) :291-293
[3]   A NEW MICROSCOPIC PRINCIPLE [J].
GABOR, D .
NATURE, 1948, 161 (4098) :777-778
[4]   OPTICAL COHERENCE TOMOGRAPHY [J].
HUANG, D ;
SWANSON, EA ;
LIN, CP ;
SCHUMAN, JS ;
STINSON, WG ;
CHANG, W ;
HEE, MR ;
FLOTTE, T ;
GREGORY, K ;
PULIAFITO, CA ;
FUJIMOTO, JG .
SCIENCE, 1991, 254 (5035) :1178-1181
[5]   PHASE RETRIEVAL AND TWIN-IMAGE ELIMINATION FOR IN-LINE FRESNEL HOLOGRAMS [J].
LIU, G ;
SCOTT, PD .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1987, 4 (01) :159-165
[6]   Potential of digital holography in particle measurement [J].
Murata, S ;
Yasuda, N .
OPTICS AND LASER TECHNOLOGY, 2000, 32 (7-8) :567-574
[7]   Direct three-dimensional shape measurement by digital light-in-flight holography [J].
Nilsson, B ;
Carlsson, TE .
APPLIED OPTICS, 1998, 37 (34) :7954-7959
[8]   Shape measurement of microscopic structures using digital holograms [J].
Pedrini, G ;
Fröning, P ;
Tiziani, HJ ;
Santoyo, FM .
OPTICS COMMUNICATIONS, 1999, 164 (4-6) :257-268
[9]   Highly sensitive pulsed digital holography for built-in defect analysis with a laser excitation [J].
Schedin, S ;
Pedrini, G ;
Tiziani, HJ ;
Aggarwal, AK ;
Gusev, ME .
APPLIED OPTICS, 2001, 40 (01) :100-103
[10]  
SCHNARS U, 1994, APPL OPTICS, V22, P1790