On the incorporation mechanism of Fe in GaN grown by metal-organic vapour phase epitaxy

被引:30
作者
Balmer, R. S. [1 ]
Soley, D. E. J. [1 ]
Simons, A. J. [1 ]
Mace, J. D. [1 ]
Koker, L. [1 ]
Jackson, P. O. [1 ]
Wallis, D. J. [1 ]
Uren, M. J. [1 ]
Martin, T. [1 ]
机构
[1] QinetiQ Ltd, Malvern Technol Ctr, St Andrews Rd, Malvern WR14 3PS, Worcs, England
来源
PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 3, NO 6 | 2006年 / 3卷 / 06期
关键词
D O I
10.1002/pssc.200565282
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report an investigation of the incorporation mechanism of iron (Fe) as a dopant in GaN grown by MOVPE. A series of Fe doped GaN structures were studied by secondary ion mass spectrometry (SIMS), atomic force microscopy (AFM) and X-ray photo-electron spectroscopy (XPS). A model is presented which describes the SIMS concentration profiles with excellent agreement, and, it is shown that Fe incorporation into GaN occurs via a surface segregation mechanism. This model is supported by direct measurement of a highly Fe-rich layer on the surface of Fe doped GaN by XPS. Furthermore, we find that the presence of Fe on the GaN surface promotes a transition from 2D to 3D GaN growth which is confirmed by AFM measurements of RMS roughness with increasing Fe flux. (c) 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:1429 / 1434
页数:6
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