首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
Application of laboratory X-ray diffraction equipment for Pair Distribution Function (PDF) analysis
被引:0
作者
:
Gateshki, Milen
论文数:
0
引用数:
0
h-index:
0
机构:
Malvern Panalyt BV, Almelo, Netherlands
Malvern Panalyt BV, Almelo, Netherlands
Gateshki, Milen
[
1
]
Sommariva, Marco
论文数:
0
引用数:
0
h-index:
0
机构:
Malvern Panalyt BV, Almelo, Netherlands
Malvern Panalyt BV, Almelo, Netherlands
Sommariva, Marco
[
1
]
Beckers, Detlef
论文数:
0
引用数:
0
h-index:
0
机构:
Malvern Panalyt BV, Almelo, Netherlands
Malvern Panalyt BV, Almelo, Netherlands
Beckers, Detlef
[
1
]
Prugovecki, Stjepan
论文数:
0
引用数:
0
h-index:
0
机构:
Malvern Panalyt BV, Almelo, Netherlands
Malvern Panalyt BV, Almelo, Netherlands
Prugovecki, Stjepan
[
1
]
Fransen, Martijn
论文数:
0
引用数:
0
h-index:
0
机构:
Malvern Panalyt BV, Almelo, Netherlands
Malvern Panalyt BV, Almelo, Netherlands
Fransen, Martijn
[
1
]
机构
:
[1]
Malvern Panalyt BV, Almelo, Netherlands
来源
:
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES
|
2018年
/ 74卷
关键词
:
Pair Distribution Function;
Total scattering;
Nanomaterials;
D O I
:
10.1107/S2053273318090344
中图分类号
:
O6 [化学];
学科分类号
:
0703 ;
摘要
:
MS25-P05
引用
收藏
页码:E322 / E323
页数:2
相关论文
共 3 条
[1]
Comparison of total scattering data from various sources: the case of a nanometric spinel
论文数:
引用数:
h-index:
机构:
Confalonieri, Giorgia
Dapiaggi, Monica
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Milan, I-20122 Milan, Italy
Univ Milan, I-20122 Milan, Italy
Dapiaggi, Monica
Sommariva, Marco
论文数:
0
引用数:
0
h-index:
0
机构:
PANalytical BV, Almelo, Netherlands
Univ Milan, I-20122 Milan, Italy
Sommariva, Marco
Gateshki, Milen
论文数:
0
引用数:
0
h-index:
0
机构:
PANalytical BV, Almelo, Netherlands
Univ Milan, I-20122 Milan, Italy
Gateshki, Milen
Fitch, Andy N.
论文数:
0
引用数:
0
h-index:
0
机构:
ESRF, Grenoble, France
Univ Milan, I-20122 Milan, Italy
Fitch, Andy N.
Bernasconi, Andrea
论文数:
0
引用数:
0
h-index:
0
机构:
ESRF, Grenoble, France
Univ Milan, I-20122 Milan, Italy
Bernasconi, Andrea
[J].
POWDER DIFFRACTION,
2015,
30
: S65
-
S69
[2]
On the use of laboratory X-ray diffraction equipment for Pair Distribution Function (PDF) studies
Reiss, Celeste A.
论文数:
0
引用数:
0
h-index:
0
机构:
PANalyt BV, NL-7602 EA Almelo, Netherlands
PANalyt BV, NL-7602 EA Almelo, Netherlands
Reiss, Celeste A.
Kharchenko, Alexander
论文数:
0
引用数:
0
h-index:
0
机构:
PANalyt BV, NL-7602 EA Almelo, Netherlands
PANalyt BV, NL-7602 EA Almelo, Netherlands
Kharchenko, Alexander
Gateshki, Milen
论文数:
0
引用数:
0
h-index:
0
机构:
PANalyt BV, NL-7602 EA Almelo, Netherlands
PANalyt BV, NL-7602 EA Almelo, Netherlands
Gateshki, Milen
[J].
ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS,
2012,
227
(05):
: 257
-
261
[3]
TENIJENHUIS J, 2009, Z KRISTALLOGR, V30, P163
←
1
→
共 3 条
[1]
Comparison of total scattering data from various sources: the case of a nanometric spinel
论文数:
引用数:
h-index:
机构:
Confalonieri, Giorgia
Dapiaggi, Monica
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Milan, I-20122 Milan, Italy
Univ Milan, I-20122 Milan, Italy
Dapiaggi, Monica
Sommariva, Marco
论文数:
0
引用数:
0
h-index:
0
机构:
PANalytical BV, Almelo, Netherlands
Univ Milan, I-20122 Milan, Italy
Sommariva, Marco
Gateshki, Milen
论文数:
0
引用数:
0
h-index:
0
机构:
PANalytical BV, Almelo, Netherlands
Univ Milan, I-20122 Milan, Italy
Gateshki, Milen
Fitch, Andy N.
论文数:
0
引用数:
0
h-index:
0
机构:
ESRF, Grenoble, France
Univ Milan, I-20122 Milan, Italy
Fitch, Andy N.
Bernasconi, Andrea
论文数:
0
引用数:
0
h-index:
0
机构:
ESRF, Grenoble, France
Univ Milan, I-20122 Milan, Italy
Bernasconi, Andrea
[J].
POWDER DIFFRACTION,
2015,
30
: S65
-
S69
[2]
On the use of laboratory X-ray diffraction equipment for Pair Distribution Function (PDF) studies
Reiss, Celeste A.
论文数:
0
引用数:
0
h-index:
0
机构:
PANalyt BV, NL-7602 EA Almelo, Netherlands
PANalyt BV, NL-7602 EA Almelo, Netherlands
Reiss, Celeste A.
Kharchenko, Alexander
论文数:
0
引用数:
0
h-index:
0
机构:
PANalyt BV, NL-7602 EA Almelo, Netherlands
PANalyt BV, NL-7602 EA Almelo, Netherlands
Kharchenko, Alexander
Gateshki, Milen
论文数:
0
引用数:
0
h-index:
0
机构:
PANalyt BV, NL-7602 EA Almelo, Netherlands
PANalyt BV, NL-7602 EA Almelo, Netherlands
Gateshki, Milen
[J].
ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS,
2012,
227
(05):
: 257
-
261
[3]
TENIJENHUIS J, 2009, Z KRISTALLOGR, V30, P163
←
1
→