Aberrations in preliminary design of ITER divertor impurity influx monitor

被引：7

作者：

Kitazawa, Sin-iti ^{[1
]}

Ogawa, Hiroaki ^{[1
]}

Katsunuma, Atsushi ^{[2
]}

Kitazawa, Daisuke ^{[2
]}

Ohmori, Keisuke ^{[3
]}

机构：

[1] Japan Atom Energy Agcy, Naka Fus Inst, Naka, Ibaraki 3110193, Japan

[2] Nikon Inc, Core Technol Ctr, Yokohama, Kanagawa 2448533, Japan

[3] Nikon Inc, Customized Prod Business Unit, Mito, Ibaraki 3100843, Japan

来源：

FUSION ENGINEERING AND DESIGN | 2015年 / 101卷

关键词：

ITER divertor impurity influx monitor; DIM; Plasma diagnostics; Aberration; Distortion; Spot diagram; MTF analysis; Transverse aberration diagram;

D O I：

10.1016/j.fusengdes.2015.09.003

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

Divertor impurity influx monitor for ITER (DIM) is a diagnostic system that observes light from nuclear fusion plasma directly. This system is affected by various aberrations because it observes light from the fan-array chord near the divertor in the ultraviolet near infrared wavelength range. The aberrations should be suppressed to the extent possible to observe the light with very high spatial resolution. In the preliminary design of DIM, spot diagrams were suppressed within the core of the receiving fiber's cross section, and the resulting spatial resolutions satisfied the design requirements. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：209 / 217

页数：9

共 6 条

[1]

Hecht E., 2001, Optics, V1

[2]

Iwamae A., 2009, Plasma Fusion Res., V4

[3]

Kitazawa S., 2015, PLASMA FUSION RES, V10

[4]

Ogawa H., 2006, Design of impurity influx monitor (divertor) for ITER

[5] Engineering design and R&D of Impurity Influx Monitor (divertor) for ITER [J].

Ogawa, Hiroaki ;

Sugie, Tatsuo ;

Kasai, Satoshi ;

Katsunuma, Atsushi ;

Hara, Hirotsugu ;

Takeyama, Norihide ;

Kusama, Yoshinori .

FUSION ENGINEERING AND DESIGN, 2008, 83 (10-12) :1405-1409

[6] Divertor impurity monitor for the International Thermonuclear Experimental Reactor [J].

Sugie, T ;

Ogawa, H ;

Nishitani, T ;

Kasai, S ;

Katsunuma, J ;

Maruo, M ;

Ebisawa, K ;

Ando, T ;

Kita, Y .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (01) :351-354

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