A 100 fps, Time-Correlated Single-Photon-Counting- Based Fluorescence-Lifetime Imager in 130 nm CMOS

被引：123

作者：

Field, Ryan M. ^{[1
]}

Realov, Simeon ^{[2
]}

Shepard, Kenneth L. ^{[3
]}

机构：

[1] Intel Corp, Santa Clara, CA 95054 USA

[2] Intel Corp, Hillsboro, OR 97124 USA

[3] Columbia Univ, New York, NY 10027 USA

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 2014年 / 49卷 / 04期

基金：

美国国家科学基金会;

关键词：

Fluorescence lifetime imaging microscopy ( FLIM); imaging; single-photon avalanche diodes ( SPADs); time-correlated single-photon counting ( TCSPC); time-to-digital converter ( TDC); AVALANCHE-DIODE ARRAY; PHOTODIODES; MICROSCOPY; SENSOR;

D O I：

10.1109/JSSC.2013.2293777

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A fully-integrated single-photon avalanche diode ( SPAD) and time-to-digital converter ( TDC) array for high-speed fluorescence lifetime imaging microscopy ( FLIM) in standard 130 nm CMOS is presented. This imager is comprised of an array of 64-by-64 SPADs each with an independent TDC for performing time-correlated single-photon counting ( TCSPC) at each pixel. The TDCs use a delay-locked-loop-based architecture and achieve a 62.5 ps resolution with up to a 64 ns range. A data-compression datapath is designed to transfer TDC data to off-chip buffers, which can support a data rate of up to 42 Gbps. These features, combined with a system implementation that leverages a x4 PCIe-cabled interface, allow for demonstrated FLIM imaging rates at up to 100 frames per second.

引用

收藏

页码：867 / 880

页数：14

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