Beam geometry, alignment, and wavefront aberration effects on interferometric differential wavefront sensing

被引:19
作者
Yu, Xiangzhi [1 ]
Gillmer, S. R. [1 ]
Ellis, J. D. [1 ,2 ]
机构
[1] Univ Rochester, Dept Mech Engn, Rochester, NY 14627 USA
[2] Univ Rochester, Inst Opt, Rochester, NY 14627 USA
基金
美国国家科学基金会;
关键词
interferometry; metrological instrumentation; optical metrology; stage calibration; TOTAL-INTERNAL-REFLECTION; HETERODYNE INTERFEROMETER; PERIODIC NONLINEARITY; DISPLACEMENT INTERFEROMETRY; OPTICAL INTERFEROMETERS; AUTOMATIC ALIGNMENT; SYSTEM; ACCURACY; ANGLES;
D O I
10.1088/0957-0233/26/12/125203
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Heterodyne interferometry is a widely accepted methodology with high resolution in many metrology applications. As a functionality enhancement, differential wavefront sensing ( DWS) enables simultaneous measurement of displacement, pitch, and yaw using a displacement interferometry system and a single beam incident on a plane mirror target. The angular change is measured using a weighted phase average between symmetrically adjacent quadrant photodiode pairs. In this paper, we present an analytical model to predict the scaling of differential phase signals based on fundamental Gaussian beams. Several numerical models are presented to discuss the effects of physical beam parameters, detector size, system alignment errors, and beam wavefront aberrations on the DWS technique. The results of our modeling predict rotational scaling factors and a usable linear range. Furthermore, experimental results show the analytically predicted scaling factor is in good agreement with empirical calibration. Our three degree-of-freedom interferometer can achieve a resolution of 0.4 nm in displacement and 0.2 mu rad in pitch and yaw simultaneously.
引用
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页数:11
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