Super-resolution and optical sectioning integrated structured illumination microscopy

被引：8

作者：

Dan, Dan ^{[1
]}

Gao, Peng ^{[2
]}

Zhao, Tianyu ^{[1
,3
]}

Dang, Shipei ^{[1
,3
]}

Qian, Jia ^{[1
,3
]}

Lei, Ming ^{[1
]}

Min, Junwei ^{[1
]}

Yu, Xianghua ^{[1
]}

Yao, Baoli ^{[1
,3
]}

机构：

[1] Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China

[2] Xidian Univ, Sch Phys & Optoelect Engn, Xian 710071, Peoples R China

[3] Univ Chinese Acad Sci, Beijing 100049, Peoples R China

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2021年 / 54卷 / 07期

基金：

中国国家自然科学基金;

关键词：

structured illumination microscopy; super-resolution; optical sectioning; STIMULATED-EMISSION; RESOLUTION LIMIT; NANOSCOPY; ORGANELLE;

D O I：

10.1088/1361-6463/abc4a8

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Super-resolution structured illumination microscopy (SR-SIM) has attracted a great deal of attention in the past few decades. As a wide-field imaging technique, SR-SIM usually suffers from issues relating to out-of-focus background, particularly when imaging thick samples. In this study, we develop an integrated SIM with simultaneous SR and optical sectioning (OS) capabilities, facilitating SR imaging of stacked optical sections, with the out-of-focus background suppressed. The combination of the merits of SR and OS is realized by means of a new image reconstruction algorithm. We confirm the validity of the integrated SIM, both experimentally and in simulation. We anticipate that this integrated SIM will assist biologists in obtaining much clearer SR images in relation to thick specimens.

引用

页数：9

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