Spectroscopic near-field microscopy using frequency combs in the mid-infrared

被引:59
作者
Brehm, Markus [1 ]
Schliesser, Albert
Keilmann, Fritz
机构
[1] Max Planck Inst Biochem, D-82152 Munich, Germany
[2] CeNS, D-82152 Munich, Germany
来源
OPTICS EXPRESS | 2006年 / 14卷 / 23期
关键词
D O I
10.1364/OE.14.011222
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We introduce a new concept of spectroscopic near-field optical microscopy that records broad infrared spectra at each pixel during scanning. Two coherent beams with harmonic frequency-comb spectra are employed, one for illuminating the scanning tip, the other as reference for multi-heterodyne detection of the scattered light. Our implementation yields 200 cm(-1) wide amplitude and phase spectra centered at 950 cm(-1) ( this band can be tuned between 700 and 1400 cm(-1)). We introduce a new technique of background suppression enabled by the short, 10 mu s "snapshot" acquisition of infrared spectra which allows time-resolving the tapping motion. Thus we demonstrate broad-band mid-infrared near-field imaging that is essentially free of background artefacts. (c) 2006 Optical Society of America.
引用
收藏
页码:11222 / 11233
页数:12
相关论文
共 41 条
  • [1] High-resolution THz spectrometer with kHz scan rates
    Bartels, A
    Thoma, A
    Janke, C
    Dekorsy, T
    Dreyhaupt, A
    Winnerl, S
    Helm, M
    [J]. OPTICS EXPRESS, 2006, 14 (01) : 430 - 437
  • [2] Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution
    Brehm, Markus
    Taubner, Thomas
    Hillenbrand, Rainer
    Keilmann, Fritz
    [J]. NANO LETTERS, 2006, 6 (07) : 1307 - 1310
  • [3] PUMP PROBE METHOD FOR FAST ANALYSIS OF VISIBLE SPECTRAL SIGNATURES UTILIZING ASYNCHRONOUS OPTICAL-SAMPLING
    ELZINGA, PA
    KNEISLER, RJ
    LYTLE, FE
    JIANG, Y
    KING, GB
    LAURENDEAU, NM
    [J]. APPLIED OPTICS, 1987, 26 (19): : 4303 - 4309
  • [4] Fischer C, 2003, TOP APPL PHYS, V89, P97
  • [5] Nanometer-scale probing of optical and thermal near-fields with an apertureless NSOM
    Formanek, F
    De Wilde, Y
    Aigouy, L
    Kwok, WK
    Paulius, L
    Chen, Y
    [J]. SUPERLATTICES AND MICROSTRUCTURES, 2004, 35 (3-6) : 315 - 323
  • [6] Far-field background suppression in tip-modulated apertureless near-field optical microscopy
    Gucciardi, Pietro Giuseppe
    Bachelier, Guillaume
    [J]. JOURNAL OF APPLIED PHYSICS, 2006, 99 (12)
  • [7] High-resolution near-field Raman microscopy of single-walled carbon nanotubes -: art. no. 095503
    Hartschuh, A
    Sánchez, EJ
    Xie, XS
    Novotny, L
    [J]. PHYSICAL REVIEW LETTERS, 2003, 90 (09) : 4
  • [8] Complex optical constants on a subwavelength scale
    Hillenbrand, R
    Keilmann, F
    [J]. PHYSICAL REVIEW LETTERS, 2000, 85 (14) : 3029 - 3032
  • [9] Pure optical contrast in scattering-type scanning near-field microscopy
    Hillenbrand, R
    Knoll, B
    Keilmann, F
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 2001, 202 : 77 - 83
  • [10] Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy
    Hillenbrand, R
    Keilmann, F
    [J]. APPLIED PHYSICS LETTERS, 2002, 80 (01) : 25 - 27