Detection of localized ferromagnetic resonance in a continuous thin film via magnetic resonance force microscopy

被引：13

作者：

Nazaretski, E. ^{[1
]}

Pelekhov, D. V. ^{[2
]}

Martin, I. ^{[1
]}

Zalalutdinov, M. ^{[3
]}

Ponarin, D. ^{[4
]}

Smirnov, A. ^{[4
]}

Hammel, P. C. ^{[2
]}

Movshovich, R. ^{[1
]}

机构：

[1] Los Alamos Natl Lab, Los Alamos, NM 87545 USA

[2] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA

[3] SFA Inc, Crofton, MD 21114 USA

[4] N Carolina State Univ, Dept Chem, Raleigh, NC 27695 USA

来源：

PHYSICAL REVIEW B | 2009年 / 79卷 / 13期

基金：

美国国家科学基金会;

关键词：

ferromagnetic materials; ferromagnetic resonance; magnetic force microscopy; magnetic thin films; micromagnetics; Permalloy; SURFACE; TIP; FMR;

D O I：

10.1103/PhysRevB.79.132401

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present magnetic resonance force microscopy (MRFM) measurements of ferromagnetic resonance in a 50 nm thick permalloy film tilted with respect to the direction of the external magnetic field. At small probe-sample distances the MRFM spectrum breaks up into multiple modes, which we identify as local ferromagnetic resonances confined by the magnetic field of the MRFM tip. Micromagnetic simulations support this identification of the modes and show they are stabilized in the region where the dipolar tip field has a component antiparallel to the applied field.

引用

页数：4

共 20 条

[1] Magnetic resonance studies of the fundamental spin-wave modes in individual submicron Cu/NiFe/Cu perpendicularly magnetized disks [J].