Raman spectroscopic investigations of epitaxial BiFeO3 thin films on rare earth scandate substrates

被引：23

作者：

Talkenberger, Andreas ^{[1
]}

Vrejoiu, Ionela ^{[2
]}

Johann, Florian ^{[2
]}

Roeder, Christian ^{[1
]}

Irmer, Gert ^{[1
]}

Rafaja, David ^{[3
]}

Schreiber, Gerhard ^{[3
]}

Kortus, Jens ^{[1
]}

Himcinschi, Cameliu ^{[1
]}

机构：

[1] Tech Univ Bergakad Freiberg, Inst Theoret Phys, D-09596 Freiberg, Germany

[2] Max Planck Inst Microstruct Phys, D-06120 Halle, Germany

[3] Tech Univ Bergakad Freiberg, Inst Mat Sci, D-09596 Freiberg, Germany

来源：

JOURNAL OF RAMAN SPECTROSCOPY | 2015年 / 46卷 / 12期

关键词：

Raman tensor; multiferroic; thin film; bismuth ferrite; azimuthal rotation; SCATTERING; TEMPERATURE;

D O I：

10.1002/jrs.4762

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

BiFeO3 epitaxial thin films fabricated by pulsed laser deposition on different scandate substrates were investigated by means of Raman spectroscopy. Weobserved periodic changes in Raman position, fullwidth at half maximum and intensity for some phonon modes as a function of the azimuthal angle phi. Further analysis revealed the possibility to assign the so far controversial discussed Raman modes at low wavenumbers (< 250 cm(-1)) through rotational Raman measurements at different azimuthal angles, which show high sensitivity to the aforementioned parameters. Furthermore, the ferroelectric/ferroelastic domain structure shown by piezo-response force microscopy investigations of the samples was confirmed. Our results are supported by symmetry-based calculations including the analysis of Raman scattering geometry as well as the dielectric function of BiFeO3 in the infrared range. Copyright (c) 2015 John Wiley & Sons, Ltd.

引用

页码：1245 / 1254

页数：10

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