Photon tunneling in a frustrated-total-internal-reflection structure composed of a single negative material

被引:12
作者
Xiang Yuan-Jiang
Wen Shuang-Chun [1 ]
Tang Kang-Song
机构
[1] Hunan Univ, Sch Comp & Commun, Changsha 410082, Peoples R China
[2] Hunan Univ, Dept Appl Phys, Changsha 410082, Peoples R China
关键词
photon tunneling; negative refraction; single negative material; superluminal;
D O I
10.7498/aps.55.2714
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The tunneling time,and lateral shift of photon tunneling in a frustrated-total-internal-reflection structure composed of single negative material is derived by employing stationary-phase approximation. It is found that the tunneling time and the lateral shift are negative when the barrier is a single negative material. On account of the Hartman effect of the tunneling time and the lateral shift, the photon tunneling shows the superluminal property. An effective approach to distinguish e-negative material and mu-negative material is proposed based on the fact that TE- and TM-polarized incident beams experience opposite lateral shift.
引用
收藏
页码:2714 / 2719
页数:6
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