Consistent noise models for analysis and design of CMOS circuits

被引:29
作者
Arnaud, A
Galup-Montoro, C
机构
[1] Univ Republica, Fac Ingn, Microelect Grp, Montevideo, Uruguay
[2] Univ Fed Santa Catarina, Dept Elect Engn, Integrated Circuits Lab, BR-88040900 Florianopolis, SC, Brazil
关键词
1/f noise; compact modeling; low-noise design; MOSFET; noise;
D O I
10.1109/tcsi.2004.835028
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Simple, physics-based MOSFET noise models, valid over the linear, saturation, and subthreshold operation regions are presented. The consistency of the models representing series-parallel associations of transistors is verified. Simple formulas for hand analysis using the inversion level concept are developed. The proportionality between the flicker noise corner frequency and the transistor transition frequency is proved and experimentally verified under wide bias conditions. Application of the noise models to a low-noise design is shown.
引用
收藏
页码:1909 / 1915
页数:7
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