Quality Assurance methodology for the ATLAS Inner Tracker strip sensor production

被引:11
作者
Ullan, M. [1 ]
Allport, P. [2 ]
Dette, K. [3 ]
Fadeyev, V. [4 ]
Fernandez-Tejero, J. [1 ]
Fleta, C. [1 ]
Gonella, L. [2 ]
Kopsalis, I. [2 ]
Orr, R. S. [3 ]
Unno, Y. [5 ]
机构
[1] CSIC, Ctr Nacl Microelect IMB CNM, Campus UAB Bellaterra, Barcelona 08193, Spain
[2] Univ Birmingham, Sch Phys & Astron, Birmingham B15 2TT, W Midlands, England
[3] Univ Toronto, Dept Phys, 60 St George St, Toronto, ON M5S 1A7, Canada
[4] Univ Calif Santa Cruz, Santa Cruz Inst Particle Phys SCIPP, Santa Cruz, CA 95064 USA
[5] KEK, IPNS, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan
基金
欧盟地平线“2020”; 英国科学技术设施理事会; 加拿大自然科学与工程研究理事会;
关键词
Large area strip sensors; HL-LHC; ATLAS ITk; Quality Assurance; Sensor irradiation; Test structures; PUNCH-THROUGH-PROTECTION; SILICON SENSORS; RADIATION; DESIGN;
D O I
10.1016/j.nima.2020.164521
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The production of the strip sensors for the ATLAS Inner Tracker (ITk) will start in 2020. Nearly 22,000 large area sensors will be produced over a period of about five years by Hamamatsu Photonics K.K. (HPK). The institutes involved in the sensor development and production are committed to deliver and maintain the highest quality sensors for the experiment. A Quality Assurance (QA) strategy has been prepared to be carried out during the whole production period. Once the process has been characterized as providing the required pre-irradiation specifications and the proper radiation hardness, the onus is on the manufacturer to rigidly stick to that qualified process. Still, sample testing with specific device-element structures and irradiation of devices should be implemented by the ITk sensor collaboration. A detailed irradiation and testing plan has been prepared by the ATLAS-ITk Collaboration, together with a newly designed test chip with specific structures to monitor different key technological and device parameters during the whole production. The tests and irradiations will be carried out on a sample basis. In order to have a practical methodology, samples from alternating batches will be sent for irradiations with protons, neutrons and gammas, and then tested in order to check that the characteristics remain within specifications. The detailed plan and the design and test methods for the structures in the test chip are presented here.
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页数:8
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