High-sensitivity instrumentation for spectrally-resolved optically detected X-ray absorption spectroscopy

被引:12
作者
Poolton, NRJ [1 ]
Botter-Jensen, L
Denby, PM
Nakamura, T
Hamilton, B
Pantos, E
机构
[1] Daresbury Lab, Synchrotron Radiat Dept, Warrington WA4 4AD, Cheshire, England
[2] Riso Natl Lab, Radiat Res Dept, DK-4000 Roskilde, Denmark
[3] Shizuoka Univ, Fac Engn, Dept Mat Sci & Technol, Hamamatsu, Shizuoka 4328561, Japan
[4] Univ Manchester, Inst Sci & Technol, Dept Phys, Manchester M60 1QD, Lancs, England
基金
英国工程与自然科学研究理事会;
关键词
synchrotron; luminescence; spectrometer; XAS; OD-XAS; XEOL;
D O I
10.1016/j.nimb.2004.05.003
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The design use and implementation of simple but highly efficient instrumentation is described, that allows for the possibility of wavelength-resolving optically detected X-ray absorption spectra (OD-XAS) of even the weakest luminescent systems emitting in the range 380-1020 nm (1.2-3.3 eV). The instrument, based on linearly-variable interference filters, provides significant improvement in light throughput as compared with standard grating monochromators, and is used to demonstrate the power of wavelength-resolved OD-XAS in unravelling luminescence processes that are typically encountered in two common types of systems: (i) single-phase materials that possess a combination of radically different recombination pathways and (ii) materials where the recombination mechanisms are essentially invariant throughout the system, but which are chemically phase-separated on a sub-microscopic scale. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:590 / 598
页数:9
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