Defining coverage views to improve functional coverage analysis

被引：8

作者：

Asaf, S ^{[1
]}

Marcus, E ^{[1
]}

Ziv, A ^{[1
]}

机构：

[1] IBM Res Lab Haifa, IL-31905 Haifa, Israel

来源：

41ST DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2004 | 2004年

关键词：

functional verification; coverage analysis;

D O I：

10.1145/996566.996579

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Coverage analysis is used to monitor the quality of the verification process. Reports provided by coverage tools help users identify areas in the design that have not been adequately tested. Because of their sheer size, the analysis of large coverage models can be an intimidating and time-consuming task. Practically, it can only be done by focusing on specific parts of the model. This paper presents a method for defining views onto the coverage data of cross-product functional coverage models. The proposed method allows users to focus on certain aspects of the coverage data to extract relevant, useful information, thereby improving the quality of the coverage analysis. A number of examples are provided that show how the proposed method improved the verification of actual designs.

引用

页码：41 / 44

页数：4

共 7 条

[1]

AHI AM, 1992, HEWLETT PACKARD J, V14

[2]

CODD EF, 1970, COMMUN ACM, V13, P377, DOI [10.1145/362384.362685, 10.1145/357980.358007]

[3]

Fine S, 2003, DES AUT CON, P286

[4] Functional verification methodology for microprocessors using the Genesys test-program generator - Application to the x86 microprocessors family [J].

Fournier, L ;

Arbetman, Y ;

Levinger, M .

DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS, 1999, :434-441

[5]

GRIMWALD R, 1998, P 35 DES AUT C JUN, P158

[6]

Lachish O, 2002, DES AUT CON, P807, DOI 10.1109/DAC.2002.1012733

[7]

MARICK B, 1985, CRAFT SOFTWARE TESTI

← 1 →