Excitons in Si nanocrystals:: Confinement and migration effects -: art. no. 195309

被引:174
作者
Heitmann, J
Müller, F
Yi, LX
Zacharias, M
Kovalev, D
Eichhorn, F
机构
[1] Max Planck Inst Mikrostrukturphys, D-06120 Halle Saale, Germany
[2] Tech Univ Munich, Dept E16, D-85747 Garching, Germany
[3] Rossendorf Inc, Forschungszentrum Rossendorf EV, Inst Ionenstrahlphys & Mat Forsch, D-01314 Dresden, Germany
关键词
D O I
10.1103/PhysRevB.69.195309
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A detailed analysis of the strong room-temperature photoluminescence (PL) signal of size controlled nc-Si is reported. The size control of nc-Si is realized by evaporation of SiO/SiO2 superlattices and subsequent thermally induced phase separation. By this method the synthesis of completely SiO2 passivated Si nanocrystals with a controlled size is demonstrated. A strong blueshift of the photoluminescence signal from 1.3 to 1.65 eV with decreasing crystal size is observed. Resonant photoluminescence measurements prove the breakdown of the k-conservation rule for nc-Si by showing an increase in the no-phonon transition probability with decreasing crystal size. A no-phonon to phonon assisted transition probability ratio above 1 is detected at 4.5 K. These results confirm quantum confinement as the origin of the investigated luminescence signal. The size dependence of the different luminescence properties and the very high no-phonon transition probability indicate a lower confinement barrier compared to other systems containing nc-Si and additional migration effects of the excitons between the nanocrystals. A separation of quantum confinement and migration effects on the PL signal is possible due to the very narrow size distribution of the nc-Si and detailed time and temperature dependent investigations of the photoluminescence.
引用
收藏
页码:195309 / 1
页数:7
相关论文
共 32 条
[1]   Tuning the emission wavelength of Si nanocrystals in SiO2 by oxidation [J].
Brongersma, ML ;
Polman, A ;
Min, KS ;
Boer, E ;
Tambo, T ;
Atwater, HA .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2577-2579
[2]   Dependence of the optical gap of Si quantum dots on the dot size [J].
Burdov, VA .
SEMICONDUCTORS, 2002, 36 (10) :1154-1158
[3]   IDENTIFICATION OF RADIATIVE TRANSITIONS IN HIGHLY POROUS SILICON [J].
CALCOTT, PDJ ;
NASH, KJ ;
CANHAM, LT ;
KANE, MJ ;
BRUMHEAD, D .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1993, 5 (07) :L91-L98
[4]   SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS [J].
CANHAM, LT .
APPLIED PHYSICS LETTERS, 1990, 57 (10) :1046-1048
[5]   THEORETICAL ASPECTS OF THE LUMINESCENCE OF POROUS SILICON [J].
DELERUE, C ;
ALLAN, G ;
LANNOO, M .
PHYSICAL REVIEW B, 1993, 48 (15) :11024-11036
[6]   Effect of different preparation conditions on light emission from silicon implanted SiO2 layers [J].
Ghislotti, G ;
Nielsen, B ;
AsokaKumar, P ;
Lynn, KG ;
Gambhir, A ;
DiMauro, LF ;
Bottani, CE .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (11) :8660-8663
[7]   Fabrication of nanometer sized Si dot multilayers and their photoluminescence properties [J].
Hirano, Y ;
Sato, F ;
Saito, N ;
Abe, M ;
Miyazaki, S ;
Hirose, M .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2000, 266 :1004-1008
[8]   Structured films of light-emitting silicon nanoparticles produced by cluster beam deposition [J].
Huisken, F ;
Kohn, B ;
Paillard, V .
APPLIED PHYSICS LETTERS, 1999, 74 (25) :3776-3778
[9]   ABSORPTION AND EMISSION OF LIGHT IN NANOSCALE SILICON STRUCTURES [J].
HYBERTSEN, MS .
PHYSICAL REVIEW LETTERS, 1994, 72 (10) :1514-1517
[10]   Visible light emission from Si nanocrystalline composites via reactive evaporation of SiO [J].
Kahler, U ;
Hofmeister, H .
OPTICAL MATERIALS, 2001, 17 (1-2) :83-86