Element substitution from substrates in Bi2Se3, Bi2Te3 and Sb2Te3 overlayers deposited by hot wall epitaxy

被引:8
作者
Takagaki, Y. [1 ]
Jahn, U. [1 ]
Jenichen, B. [1 ]
Berlin, K. [1 ]
Kong, X. [1 ]
Biermann, K. [1 ]
机构
[1] Paul Drude Inst Festkorperelekt, D-10117 Berlin, Germany
关键词
hot wall epitaxy; topological insulator; chalcogenide; MOLECULAR-BEAM EPITAXY; IN2SE3; THIN-FILMS; ELECTRICAL-PROPERTIES; OPTICAL-PROPERTIES; CRYSTAL-STRUCTURES; GROWTH; SEMICONDUCTOR; SE;
D O I
10.1088/0268-1242/29/9/095021
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In depositing Bi2Se3, Bi2Te3 or Sb2Te3 layers on certain substrates by hot wall epitaxy, the Bi and Sb atoms in the layers are replaced by the atoms supplied from the substrates. We extend our exploration on this substitution phenomenon for a number of combinations of the layer and the substrate to infer the factors that determine the occurrence of the substitution. Using a series of Ga- and In-based III-V substrates, it is evidenced that the group III atoms substitute the group V overlayer atoms when the bonds in the substrates are weak. We demonstrate that Ag triggers the substitution more effectively than Cu as a catalyst. The competition between the catalyst-induced substitutions on ternary alloy substrates shows that the dependence on the bond strength is not as strong as to be exclusive. Additionally, defectiveness around the interface between a semicoherently grown alpha-In2Se3 layer produced by the substitution and the InAs substrate is demonstrated. The cathodeluminescence properties are also provided focusing on the dependence on the phase of In2Se3.
引用
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页数:13
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