Characterization of fine surfaces using an atomic force microscope mounted on a coordinate measuring machine

被引：0
|
作者：
Kofod, N [1 ]
Hansen, HN [1 ]
De Chiffre, L [1 ]
机构：
[1] Tech Univ Denmark, Dept Mfg Engn, DK-2800 Lyngby, Denmark
来源：
PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2 | 1999年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A newly developed integrated system for topographic characterization of fine surfaces was used to investigate biomedical items. The system comprises an atomic force microscope (AFM) mounted on a coordinate measuring machine (CMM), allowing free positioning of the AFM probe in space. Surface roughness measurements were carried out on titanium plates for dental applications as well as on hip joint implants. These investigations have shown the ability of the system to cover large areas with AFM scans.
引用
收藏
页码：278 / 281
页数：4
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