Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)

被引：44

作者：

Britton, T. B. ^{[1
]}

Hickey, J. L. R. ^{[1
]}

机构：

[1] Imperial Coll London, Dept Mat, Exhibit Rd, London SW7 2AZ, England

来源：

EMAS 2017 WORKSHOP - 15TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS & IUMAS-7 MEETING - 7TH MEETING OF THE INTERNATIONAL UNION OF MICROBEAM ANALYSIS SOCIETIES | 2018年 / 304卷

关键词：

DISLOCATION DENSITY DISTRIBUTIONS; ELASTIC STRAIN-MEASUREMENT; STRESS-FIELDS; GRAIN; ACCURACY; MISORIENTATIONS; ROTATIONS; PRECISION; PATTERNS;

D O I：

10.1088/1757-899X/304/1/012003

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to 'conventional' Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative misorientations of 1 x 10(-4) rads (similar to 0.006 degrees) and changes in (deviatoric) lattice strain with a precision of 1 x 10(-4). This is achieved through direct comparison of two or more diffraction patterns using sophisticated cross-correlation based image analysis routines. Image shifts between zone axes in the two-correlated diffraction pattern are measured with sub-pixel precision and this realises the ability to measure changes in interplanar angles and lattice orientation with a high degree of sensitivity. These shifts are linked to strains and lattice rotations through simple geometry. In this manuscript, we outline the basis of the technique and two case studies that highlight its potential to tackle real materials science challenges, such as deformation patterning in polycrystalline alloys.

引用

页数：13

共 45 条

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