Effects of Post-deposition Annealing on Epitaxial CoO/Fe3O4 Bilayers on SrTiO3(001) and Formation of Thin High-Quality Cobalt Ferrite-like Films

被引:5
作者
Thien, Jannis [1 ]
Bahlmann, Jascha [1 ]
Alexander, Andreas [1 ]
Hoppe, Martin [1 ,2 ]
Pohlmann, Tobias [1 ,2 ]
Ruwisch, Kevin [1 ]
Meyer, Carola [1 ]
Bertram, Florian [2 ]
Kuepper, Karsten [1 ]
Wollschlaeger, Joachim [1 ]
机构
[1] Osnabruck Univ, Dept Phys, D-49076 Osnabruck, Germany
[2] DESY, Photon Sci, D-22607 Hamburg, Germany
关键词
X-RAY PHOTOELECTRON; IRON-OXIDE FILMS; OXYGEN REDUCTION; COFE2O4; PHOTOEMISSION; OXIDATION; NANOPARTICLES; SPECTROSCOPY; BEAMLINE; SPECTRA;
D O I
10.1021/acs.jpcc.0c05503
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In order to explore an alternative pathway to prepare ultrathin CoFe2O4 films, epitaxial CoO/Fe3O4 bilayers with varying film thickness of the CoO film were grown on Nb-doped SrTiO3(001) substrates via reactive molecular beam epitaxy. Thereafter, cobalt ferrite films with varying stoichiometry were prepared by post-deposition annealing at different temperatures. The thermally mediated interdiffusion resulted in the formation of vertical compressive and lateral tensile strained CoxFe3-xO4 films (x = 0.6 - 1.4) with homogeneous distribution of Fe and Co cations for each film. The chemical and electronic variations after each annealing step were studied by means of soft and hard X-ray photoelectron spectroscopy. The homogeneity of the cation distributions in the films were additionally verified after the last annealing step by angle-resolved hard X-ray photoelectron spectroscopy. For the cobalt ferrite film with x = 1.4, an additional crystallographic phase of Co1-yFeyO was observed by (grazing incidence) X-ray diffraction measurements after annealing at 600 degrees C. X-ray reflectivity measurements were performed to determine the film thickness of the formed CoxFe3-xO4 films.
引用
收藏
页码:23895 / 23904
页数:10
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