Characteristics of GaN and AlGaN/GaN FinFETs

被引:33
|
作者
Im, Ki-Sik [1 ]
Kang, Hee-Sung [1 ]
Lee, Jae-Hoon [2 ]
Chang, Sung-Jae [3 ]
Cristoloveanu, Sorin [3 ]
Bawedin, Maryline [4 ]
Lee, Jung-Hee [1 ]
机构
[1] Kyungpook Natl Univ, Sch Elect Engn, Taegu 702701, South Korea
[2] Samsung Elect Co Ltd, Syst LSI, Discrete Dev Team, Giheung, South Korea
[3] Grenoble Inst Technol, IMEP LAHC, F-38016 Grenoble 1, France
[4] Univ Montpellier 2, IES, F-34095 Montpellier, France
基金
新加坡国家研究基金会;
关键词
AlGaN/GaN; MOSFET; Normally-off; FinFET; Junctionless; Nanochannel; FRINGING FIELDS; SOI MOSFETS; GATE; HETEROSTRUCTURES; PERFORMANCE; TRANSISTORS;
D O I
10.1016/j.sse.2014.04.033
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
AlGaN/GaN FinFETs, with high quality atomic layer deposited (ALD) Al2O3 gate dielectric, have been fabricated. The devices have a two-dimensional electron gas (2DEG) channel formed at AlGaN/GaN heterointerface and two sidewall GaN MOS channels. Two distinct transconductance peaks can be observed, one for the 2DEG channel and the other for the sidewall GaN MOS channels. On the other hand, we present heterojunction-free GaN FinFETs with junctionless configuration. The current flows through the volume of the heavily doped GaN fin rather than at the surface channel, which leads to superior off-state performance and less drain-induced virtual substrate biasing (DIVSB) effect. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码:66 / 75
页数:10
相关论文
共 50 条
  • [1] A modified analytical model for AlGaN/GaN FinFETs I - V characteristics
    Ahmed, U. F.
    Ahmed, M. M.
    Memon, Q. D.
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2020, 35 (03)
  • [2] Self-Aligned AlGaN/GaN FinFETs
    Brown, David F.
    Tang, Yan
    Regan, Dean
    Wong, Joel
    Micovic, Miroslav
    IEEE ELECTRON DEVICE LETTERS, 2017, 38 (10) : 1445 - 1448
  • [3] Subthreshold Characteristics of AlGaN/GaN MIS-FinFETs with Controlling Threshold Voltages
    Dai, Quan
    Lee, Jung-Hee
    ELECTRONICS, 2020, 9 (11) : 1 - 9
  • [4] Temperature-dependent characteristics of AlGaN/GaN FinFETs with sidewall MOS channel
    Im, Ki-Sik
    Kang, Hee-Sung
    Kim, Do-Kywn
    Vodapally, Sindhuri
    Park, YoHan
    Lee, Jae-Hoon
    Kim, Yong-Tae
    Cristoloveanu, Sorin
    Lee, Jung-Hee
    SOLID-STATE ELECTRONICS, 2016, 120 : 47 - 51
  • [5] Control of Transconductance in High Performance AlGaN/GaN FinFETs
    Jo, Young-Woo
    Son, Dong-Hyeok
    Won, Chul-Ho
    Sindhuri, V.
    Kim, Ji-Hyun
    Seo, Jae Hwa
    Kang, In Man
    Lee, Jung-Hee
    2015 IEEE 11TH INTERNATIONAL CONFERENCE ON POWER ELECTRONICS AND DRIVE SYSTEMS (PEDS 2015), 2015, : 684 - 686
  • [6] 1/f Noise Characteristics of AlGaN/GaN FinFETs with and without TMAH surface treatment
    Sindhuri, V.
    Son, Dong-Hyeok
    Lee, Dong-Gi
    Sakong, SungHwan
    Jeong, Yoon-Ha
    Cho, In-Tak
    Lee, Jong-Ho
    Kim, Yong-Tae
    Cristoloveanu, Sorin
    Bae, Youngho
    Im, Ki-Sik
    Lee, Jung-Hee
    MICROELECTRONIC ENGINEERING, 2015, 147 : 134 - 136
  • [7] High-Performance GaN-Based Nanochannel FinFETs With/Without AlGaN/GaN Heterostructure
    Im, Ki-Sik
    Won, Chul-Ho
    Jo, Young-Woo
    Lee, Jae-Hoon
    Bawedin, Maryline
    Cristoloveanu, Sorin
    Lee, Jung-Hee
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2013, 60 (10) : 3012 - 3018
  • [8] Anomalous sub-THz detection by GaN/AlGaN FinFETs
    Dub, M.
    Sai, P.
    But, D. B.
    Jorudas, J.
    Kasalynas, I
    Sakowicz, M.
    Cywinski, G.
    Rumyantsev, S.
    Knap, W.
    2020 23RD INTERNATIONAL MICROWAVE AND RADAR CONFERENCE (MIKON 2020), 2020, : 297 - 299
  • [9] Polarization effects in AlGaN/GaN and GaN/AlGaN/GaN heterostructures
    Heikman, S
    Keller, S
    Wu, Y
    Speck, JS
    DenBaars, SP
    Mishra, UK
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (12) : 10114 - 10118
  • [10] Polarization effects in AlGaN/GaN and GaN/AlGaN/GaN heterostructures
    Helkman, S. (sten@ece.ucsb.edu), 1600, American Institute of Physics Inc. (93):