Optical band-edge absorption of oxide compound SnO2

被引:74
作者
Roman, LS [1 ]
Valaski, R
Canestraro, CD
Magalhaes, ECS
Persson, C
Ahuja, R
da Silva, EF
Pepe, I
da Silva, AF
机构
[1] Univ Fed Parana, Dept Fis, BR-81531990 Curitiba, Parana, Brazil
[2] Univ Fed Bahia, Inst Fis, BR-40210340 Salvador, BA, Brazil
[3] Royal Inst Technol, Dept Mat Sci & Engn, SE-10044 Stockholm, Sweden
[4] Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden
[5] Univ Fed Pernambuco, Dept Fis, Cidade Univ, BR-50670901 Recife, PE, Brazil
关键词
tin oxide; transparent conducting thin film; SnO2; transparent electrodes;
D O I
10.1016/j.apsusc.2005.12.040
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Tin oxide (SnO2) is an important oxide for efficient dielectrics, catalysis, sensor devices, electrodes and transparent conducting coating oxide technologies. SnO2 thin film is widely used in glass applications due to its low infra-red heat emissivity. In this work, the SnO2 electronic band-edge structure and optical properties are studied employing a first-principle and fully relativistic full-potential linearized augmented plane wave (FPLAPW) method within the local density approximation (LDA). The optical band-edge absorption alpha(omega) of intrinsic SnO2 is investigated experimentally by transmission spectroscopy measurements and their roughness in the light of the atomic force microscopy (AFM) measurements. The sample films were prepared by spray pyrolysis deposition method onto glass substrate considering different thickness layers. We found for SnO2 qualitatively good agreement of the calculated optical band-gap energy as well as the optical absorption with the experimental results. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:5361 / 5364
页数:4
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