Self-Timed Pulsed Latch for Low-Voltage Operation With Reduced Hold Time
被引:11
|
作者:
Jeong, Hanwool
论文数: 0引用数: 0
h-index: 0
机构:
Yonsei Univ, Sch Elect & Elect Engn, Seoul 03722, South Korea
Samsung Elect Co Ltd, Yongin 17113, South KoreaYonsei Univ, Sch Elect & Elect Engn, Seoul 03722, South Korea
Jeong, Hanwool
[1
,2
]
Park, Juhyun
论文数: 0引用数: 0
h-index: 0
机构:
Yonsei Univ, Sch Elect & Elect Engn, Seoul 03722, South KoreaYonsei Univ, Sch Elect & Elect Engn, Seoul 03722, South Korea
Park, Juhyun
[1
]
Song, Seung Chul
论文数: 0引用数: 0
h-index: 0
机构:
Qualcomm Inc, San Diego, CA 92121 USAYonsei Univ, Sch Elect & Elect Engn, Seoul 03722, South Korea
Song, Seung Chul
[3
]
Jung, Seong-Ook
论文数: 0引用数: 0
h-index: 0
机构:
Yonsei Univ, Sch Elect & Elect Engn, Seoul 03722, South KoreaYonsei Univ, Sch Elect & Elect Engn, Seoul 03722, South Korea
Jung, Seong-Ook
[1
]
机构:
[1] Yonsei Univ, Sch Elect & Elect Engn, Seoul 03722, South Korea
[2] Samsung Elect Co Ltd, Yongin 17113, South Korea
A self-timed pulsed latch (STPL) is proposed for low VDD operation. By comparing input and output, the transparency window is adaptively generated in STPL, which resolves the hold time problem of the conventional pulsed latch. The measurement results from the test chip fabricated in the 65-nm technology proves that the hold time is reduced by 77% and the minimum operating supply voltage is lowered by 300 mV compared with the conventional pulsed latch. In addition, the measurement results show that the STPL can reduce the sequential overhead, because the STPL is free from setup time issue from which the conventional master-slave-based flip-flop (MSFF) suffers. The simulation results show that the input-to-output delay of STPL, which also determines the sequential overhead, is smaller by 45% in 0.6 V compared with that of the MSFF structure.