Tensile stress of thin ceramic layers measured by Fizeau interferometry

被引:0
作者
Pochmon, Michal [1 ,2 ]
Rossler, Tomas [3 ]
Hrabovsky, Miroslav [4 ]
Dellert, Armin [5 ]
Hybl, Ondrej [6 ]
Haeusler, Gerd [6 ]
机构
[1] Palacky Univ, Joint Lab Opt, 17 Listopadu 50a, Olomouc 77207, Czech Republic
[2] Acad Sci Czech Republic, Inst Phys, Olomouc 77207, Czech Republic
[3] Palacky Univ, Fac Sci, Olomouc 77146, Czech Republic
[4] Palacky Univ, Reg Ctr Adv Technol & Mat, Olomouc 77207, Czech Republic
[5] Friedrich Alexander Univ Erlangen Nuremberg, Dept Mat Sci Glass & Ceram 3, D-91058 Erlangen, Germany
[6] Univ Erlangen Nurnberg, Inst Opt, D-91508 Erlangen, Germany
来源
EXPERIMENTALNI ANALYZA NAPETI - EXPERIMENTAL STRESS ANALYSIS | 2011年
关键词
Tensile stress; Thin coating; Fizeau interferometry;
D O I
暂无
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
We introduce a method to measure stress of thin ceramic slurry layers, while they are drying on a substrate with known parameters. The method exploits the bending of the substrate, which is measured bye Fizeau interferometry.
引用
收藏
页码:321 / 324
页数:4
相关论文
共 2 条
  • [1] CORCORAN EM, 1969, J PAINT TECHNOL, V41, P635
  • [2] Timoshenko SP, 1959, ENG SOC MONOGRAPH