GHz RF front-end bandwidth time domain measurement

被引：0
|
作者：
Wang, Q [1 ]
Tang, Y [1 ]
Soma, M [1 ]
机构：
[1] Univ Washington, Seattle, WA 98195 USA
来源：
22ND IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2004年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper proposes a method and an on-chip test circuit to measure the center frequency and the bandwidth of RF front-end circuits using the peak amplitudes and the periods of the output signal in response to a realistic step input signal. The method is also suitable for implementation in external test instrumentation.
引用
收藏
页码：223 / 228
页数：6
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