RETRACTION: A review on modeling and analysis of accelerated degradation data for reliability assessment (Retraction of Vol 107, art no 113602, 2020)

被引:0
作者
Pang, Zhenan [1 ]
Si, XiaoSheng [1 ]
Hu, Changhua [1 ]
Zhang, Jianxun [1 ]
Pei, Hong [1 ]
机构
[1] Xian Inst High Tech, Xian 710025, Shaanxi, Peoples R China
关键词
D O I
10.1016/j.microrel.2020.113960
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页数:1
相关论文
共 1 条
[1]   RETRACTION: A Review on Modeling and Analysis of Accelerated Degradation Data for Reliability Assessment (Retraction of Vol 8, Pg 2361, 2017) [J].
Pang, Zhenan ;
Si, XiaoSheng ;
Hu, Changhua ;
Zhang, Jianxun ;
Pei, Hong .
MICROELECTRONICS RELIABILITY, 2020, 107