共 1 条
RETRACTION: A review on modeling and analysis of accelerated degradation data for reliability assessment (Retraction of Vol 107, art no 113602, 2020)
被引:0
作者:
Pang, Zhenan
[1
]
Si, XiaoSheng
[1
]
Hu, Changhua
[1
]
Zhang, Jianxun
[1
]
Pei, Hong
[1
]
机构:
[1] Xian Inst High Tech, Xian 710025, Shaanxi, Peoples R China
关键词:
D O I:
10.1016/j.microrel.2020.113960
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
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页数:1
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