AM noise impact on low level phase noise measurements

被引：34
作者：
Cibiel, G [1 ]
Régis, M
Tournier, É
Llopis, O
机构：
[1] CNRS, LAAS, F-31077 Toulouse 4, France
[2] Univ Toulouse 3, F-31077 Toulouse 4, France
[3] SiGe Semicond Inc, Ottawa, ON K2B 8J9, Canada
来源：
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL | 2002年 / 49卷 / 06期
关键词：
D O I：
10.1109/TUFFC.2002.1009336
中图分类号：
O42 [声学];
学科分类号：
070206 ; 082403 ;
摘要：
The influence of the source AM noise in microwave residual phase noise experiments is investigated. The noise floor degradation problem, caused by the parasitic detection of this type of noise by an unperfectly balanced mixer, is solved thanks to a refinement of the quadrature condition. The parasitic noise contribution attributable to the AM to PM (phase modulation) conversion occurring in the device under test is minimized through the development of a dedicated microwave source featuring an AM noise level as low as -170 dBc/Hz at 10 kHz offset from a 3.5 GHz carrier.
引用
收藏
页码：784 / 788
页数：5
相关论文
共 10 条
[1]   Characterization of flicker noise in GaAs MESFET's for oscillator applications [J].
Dallas, PA ;
Everard, JKA .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2000, 48 (02) :245-257
[2]  
FAULKNER TR, 0304890011 HP
[3]   Applications of interferometric signal processing to phase-noise reduction in microwave oscillators [J].
Ivanov, EN ;
Tobar, ME ;
Woode, RA .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1998, 46 (10) :1537-1545
[4]  
LANCE A, 1978, P C PREC EL MEAS, P94
[5]   Low level and reflection phase noise measurements on a FET [J].
Llopis, O ;
Juraver, JB ;
Cibiel, G ;
Graffeuil, J .
ELECTRONICS LETTERS, 2001, 37 (02) :127-129
[6]  
LLOPIS O, P 2000 IEEE INT FREQ, P511
[7]   RESIDUAL PHASE NOISE MEASUREMENTS OF VHF, UHF, AND MICROWAVE COMPONENTS [J].
MONTRESS, GK ;
PARKER, TE ;
LOBODA, MJ .
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1994, 41 (05) :664-679
[8]   Phase noise performance of microwave analog frequency dividers application to the characterization of oscillators up to the millimeter-wave range [J].
Regis, OLM ;
Desgrez, S ;
Graffeuil, J .
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1999, 46 (04) :935-940
[9]   Correlation-based phase noise measurements [J].
Rubiola, E ;
Giordano, V .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (08) :3085-3091
[10]  
Walls F. L., 1976, Proceedings of the 30th Annual Symposium on Frequency Control, P269
1