Deep Etching of LiNbO3 Using Inductively Coupled Plasma in SF6-Based Gas Mixture

被引:7
|
作者
Osipov, Artem A. [1 ]
Osipov, Armenak A. [2 ]
Iankevich, Gleb A. [3 ]
Speshilova, Anastasiya B. [4 ]
Shakhmin, Alexander [4 ]
Berezenko, Vladimir I. [4 ]
Alexandrov, Sergey E. [4 ]
机构
[1] Russian Acad Sci, Acad Univ, St Petersburg 194021, Russia
[2] Russian Acad Sci, Southern Urals Fed Res Ctr Mineral & Geoecol, Inst Mineral, Ural Branch, Miass 456317, Russia
[3] Karlsruhe Inst Technol, Inst Nanotechnol, D-76344 Eggenstein Leopoldshafen, Germany
[4] Peter Great St Petersburg Polytech Univ, Higher Sch Phys & Mat Engn, St Petersburg 195251, Russia
基金
俄罗斯基础研究基金会;
关键词
Heating; inductively coupled plasma; plasma etching; lithium niobate; SF6/O-2; plasma;
D O I
10.1109/JMEMS.2020.3039350
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work is an extensive study of the plasma chemical etching (PCE) process of single-crystalline lithium niobate (LiNbO3) in the SF6/O-2 based inductively coupled plasma (ICP). The influence of the main technological parameters of the LiNbO3 PCE process, including the distance between the sample and the lower edge of the discharge chamber, as well as the temperature of the substrate holder on the etching process rate, has been studied. It was shown that changing the temperature of the substrate holder in the range from 100 to 200 degrees C leads to a gradual rise of the etching rate from 127 to 282 nm/min. A further increase in the temperature to 250 degrees C results in a sharp increase in the etching rate to 711 nm/min. The maximum achieved etching rate in experimental series which were aimed at determining the dependence of the LiNbO3 etching rate on the temperature of the substrate holder was 812 nm/min at a substrate holder temperature of 325 degrees C. With the help of X-ray photoelectron spectroscopy (XPS) technique was found and shown that during the etching process in fluorinated plasma the nonvolatile LiF compound is formed on the surface of the treated LiNbO3. On the basis of the obtained results, the optimal process of deep (>80 mu m) LiNbO3 PCE was developed, with an etched wall inclination angle of approximate to 110 degrees, with selectivity ratio to Cr mask of approximate to 20, and an etching rate of about 300 nm/min.
引用
收藏
页码:90 / 95
页数:6
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