Artifact-free coordinate registration of heterogeneous Large-Scale Metrology systems

被引:4
|
作者
Pfeifer, Tilo [1 ]
Montavon, Benjamin [1 ]
Peterek, Martin [1 ]
Hughes, Ben [2 ]
机构
[1] Rhein Westfal TH Aachen, Lab Machine Tools & Prod Engn WZL, Aachen, Germany
[2] Natl Phys Lab, Teddington TW11 0LW, Middx, England
基金
欧盟地平线“2020”;
关键词
Metrology; Sensor; Uncertainty; DIMENSIONAL METROLOGY;
D O I
10.1016/j.cirp.2019.04.077
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Recent metrology-based manufacturing paradigms impose requirements to Large-Scale Metrology systems that can be realised overcoming individual limitations using multi-sensor architectures. Competitive and cooperative data fusion presuppose measurement systems with different incompatible targets having aligned coordinate systems. This paper presents a registration method neither probing common features nor requiring calibrated artifacts but using an uncalibrated bar equipped with two targets at fixed locations moving on a random trajectory. The underlying mathematical model allows calculating transformation parameters including analytical propagation of statistical uncertainties. Method and model are successfully validated by Monte-Carlo simulations along with experiments using laser tracker and indoor GPS. (C) 2019 Published by Elsevier Ltd on behalf of CIRP.
引用
收藏
页码:503 / 506
页数:4
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