Artifact-free coordinate registration of heterogeneous Large-Scale Metrology systems

被引：6

作者：

Pfeifer, Tilo ^{[1
]}

Montavon, Benjamin ^{[1
]}

Peterek, Martin ^{[1
]}

Hughes, Ben ^{[2
]}

机构：

[1] Rhein Westfal TH Aachen, Lab Machine Tools & Prod Engn WZL, Aachen, Germany

[2] Natl Phys Lab, Teddington TW11 0LW, Middx, England

来源：

CIRP ANNALS-MANUFACTURING TECHNOLOGY | 2019年 / 68卷 / 01期

基金：

欧盟地平线“2020”;

关键词：

Metrology; Sensor; Uncertainty; DIMENSIONAL METROLOGY;

D O I：

10.1016/j.cirp.2019.04.077

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Recent metrology-based manufacturing paradigms impose requirements to Large-Scale Metrology systems that can be realised overcoming individual limitations using multi-sensor architectures. Competitive and cooperative data fusion presuppose measurement systems with different incompatible targets having aligned coordinate systems. This paper presents a registration method neither probing common features nor requiring calibrated artifacts but using an uncalibrated bar equipped with two targets at fixed locations moving on a random trajectory. The underlying mathematical model allows calculating transformation parameters including analytical propagation of statistical uncertainties. Method and model are successfully validated by Monte-Carlo simulations along with experiments using laser tracker and indoor GPS. (C) 2019 Published by Elsevier Ltd on behalf of CIRP.

引用

页码：503 / 506

页数：4

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