Characterization of Montmorillonite doped PVA/SA blends using X-Ray Diffraction

被引：2

作者：

Hemalatha, K. ^{[1
]}

Mahadevaiah ^{[2
]}

Somashekarappa, H. ^{[1
]}

Somashekar, R. ^{[2
]}

机构：

[1] Univ Mysore, Dept Phys, Yuvarajas Coll, Mysore 570005, Karnataka, India

[2] Univ Mysore, Dept Studies Phys, Mysore 570005, Karnataka, India

来源：

SOLID STATE PHYSICS: PROCEEDINGS OF THE 58TH DAE SOLID STATE PHYSICS SYMPOSIUM 2013, PTS A & B | 2014年 / 1591卷

关键词：

Pair correlation lengths; microstructure; X-ray patterns;

D O I：

10.1063/1.4872767

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

PVA films doped with Montmorillonite was prepared by slow evaporation technique. These films have been used to record X-ray patterns at room temperature. Correlation lengths and microstructural parameters were computed using in-house program employing X-ray data. Results show that correlation lengths as well as crystallite size increases with increase in the concentration of Montmorillonite which is inconformity with the conductivity studies.

引用

页码：819 / 821

页数：3

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