Characterization of Montmorillonite doped PVA/SA blends using X-Ray Diffraction

被引：2

作者：

Hemalatha, K. ^{[1
]}

Mahadevaiah ^{[2
]}

Somashekarappa, H. ^{[1
]}

Somashekar, R. ^{[2
]}

机构：

[1] Univ Mysore, Dept Phys, Yuvarajas Coll, Mysore 570005, Karnataka, India

[2] Univ Mysore, Dept Studies Phys, Mysore 570005, Karnataka, India

来源：

SOLID STATE PHYSICS: PROCEEDINGS OF THE 58TH DAE SOLID STATE PHYSICS SYMPOSIUM 2013, PTS A & B | 2014年 / 1591卷

关键词：

Pair correlation lengths; microstructure; X-ray patterns;

D O I：

10.1063/1.4872767

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

PVA films doped with Montmorillonite was prepared by slow evaporation technique. These films have been used to record X-ray patterns at room temperature. Correlation lengths and microstructural parameters were computed using in-house program employing X-ray data. Results show that correlation lengths as well as crystallite size increases with increase in the concentration of Montmorillonite which is inconformity with the conductivity studies.

引用

页码：819 / 821

页数：3

共 50 条

[31] Three-dimensional characterization of fatigue cracks in Ti-6246 using X-ray tomography and electron backscatter diffraction
Birosca, S.
Buffiere, J. Y.
Garcia-Pastor, F. A.
Karadge, M.
Babout, L.
Preuss, M.
ACTA MATERIALIA, 2009, 57 (19) : 5834 - 5847
[32] In situ observation of liquid metal dealloying and etching of porous FeCr by X-ray tomography and X-ray diffraction
Mokhtari, Morgane
Le Bourlot, Christophe
Adrien, Jerome
Bonnin, Anne
Ludwig, Wolfgang
Geslin, Pierre-Antoine
Wada, Takeshi
Duchet-Rumeau, Jannick
Kato, Hidemi
Maire, Eric
MATERIALIA, 2021, 18
[33] Microstructure characterization of titanium-base aluminium alloys by X-ray diffraction using Warren-Averbach and Rietveld method
Ghosh, J.
Chattopadhayay, S. K.
Meikap, A. K.
Chatterjee, S. K.
JOURNAL OF ALLOYS AND COMPOUNDS, 2008, 453 (1-2) : 131 - 137
[34] Measurement of thin film elastic constants by X-ray diffraction
Faurie, D
Renault, PO
Le Bourhis, E
Villain, P
Goudeau, P
Badawi, F
THIN SOLID FILMS, 2004, 469 : 201 - 205
[35] X-ray diffraction analysis of the fine structure of carbon fiber
Tyumentsev, V. A.
Fazlitdinova, A. G.
RUSSIAN JOURNAL OF APPLIED CHEMISTRY, 2013, 86 (05) : 760 - 764
[36] Microstructure of energetic particles investigated by X-ray powder diffraction
Herrmann, M
PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION, 2006, 22 (06) : 401 - 406
[37] The analysis of homogeneously and inhomogeneously anisotropic microstructures by X-ray diffraction
Welzel, U
Mittemeijer, EJ
POWDER DIFFRACTION, 2005, 20 (04) : 376 - 392
[38] Primary extinction and the static Debye-Waller factor in the characterization of nickel texture by X-ray diffraction
Kryshtab, T.
Arenas, A. Cadena
Kryvko, A.
Gomez, J. Palacios
REVISTA MEXICANA DE FISICA, 2015, 61 (04) : 272 - 280
[39] Automated morphometrical characterization of material phases of fired clay bricks based on Scanning Electron Microscopy, Energy Dispersive X-ray Spectroscopy and Powder X-ray Diffraction
Buchner, Thomas
Kiefer, Thomas
Gaggl, Wolfgang
Zelaya-Lainez, Luis
Fuessl, Josef
CONSTRUCTION AND BUILDING MATERIALS, 2021, 288
[40] High-resolution X-ray diffraction from microstructures
Chrosch, J
Salje, EKH
FERROELECTRICS, 1997, 194 (1-4) : 149 - 159

← 1 2 3 4 5 →