Characterization of Montmorillonite doped PVA/SA blends using X-Ray Diffraction

被引：2
|
作者：
Hemalatha, K. [1 ]
Mahadevaiah [2 ]
Somashekarappa, H. [1 ]
Somashekar, R. [2 ]
机构：
[1] Univ Mysore, Dept Phys, Yuvarajas Coll, Mysore 570005, Karnataka, India
[2] Univ Mysore, Dept Studies Phys, Mysore 570005, Karnataka, India
来源：
SOLID STATE PHYSICS: PROCEEDINGS OF THE 58TH DAE SOLID STATE PHYSICS SYMPOSIUM 2013, PTS A & B | 2014年 / 1591卷
关键词：
Pair correlation lengths; microstructure; X-ray patterns;
D O I：
10.1063/1.4872767
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
PVA films doped with Montmorillonite was prepared by slow evaporation technique. These films have been used to record X-ray patterns at room temperature. Correlation lengths and microstructural parameters were computed using in-house program employing X-ray data. Results show that correlation lengths as well as crystallite size increases with increase in the concentration of Montmorillonite which is inconformity with the conductivity studies.
引用
收藏
页码：819 / 821
页数：3
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