magnetic tunnel junctions;
impurities;
resonant tunneling;
tight-binding calculation;
D O I:
10.1016/S0304-8853(01)01070-8
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Using a simple tight-binding model and the Kubo formula we have calculated the lateral distribution of the tunneling conductance across a magnetic tunnel junction probed by scanning tunneling microscopy. We find that the presence of an impurity within the barrier layer can cause a sharp spike in the conductance distribution, in agreement with recent experiments. (C) 2002 Elsevier Science B.V. All rights reserved.