Broadband Mirrors for Spectroheliographs at the KORTES Sun Study Facility

被引：2

作者：

Garakhin, S. A. ^{[1
]}

Barysheva, M. M. ^{[1
]}

Vishnyakov, E. A. ^{[2
]}

Zuev, S. Yu. ^{[1
]}

Kirichenko, A. S. ^{[2
]}

Kuzin, S. V. ^{[2
]}

Polkovnikov, V. N. ^{[1
]}

Salashchenko, N. N. ^{[1
]}

Svechnikov, M. V. ^{[1
]}

Chkhalo, N. I. ^{[1
]}

机构：

[1] Russian Acad Sci, Inst Phys Microstruct, Nizhnii Novgorod 607680, Russia

[2] Russian Acad Sci, Lebedev Phys Inst, Moscow 119991, Russia

来源：

TECHNICAL PHYSICS | 2020年 / 65卷 / 11期

基金：

俄罗斯基础研究基金会;

关键词：

EXTREME-ULTRAVIOLET; MULTILAYER MIRRORS; DESIGN; FABRICATION;

D O I：

10.1134/S1063784220110109

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on the results of development, fabrication, and analysis of broadband Mo/Si multilayer mirrors for spectroheliographs at the KORTES solar observatory, which operate in the spectral bands of 17-21 and 28-33 nm. The advantages of the stack approach are demonstrated. The results of measurements of reflection characteristics of mirrors are considered.

引用

页码：1792 / 1799

页数：8

共 17 条

[1] Multilayer optics for XUV spectral region: technology fabrication and applications [J].

Andreev, SS ;

Akhsakhalyan, AD ;

Bibishkin, MA ;

Chkhalo, NI ;

Gaponov, SV ;

Gusev, SA ;

Kluenkov, EB ;

Prokhorov, KA ;

Salashchenko, NN ;

Schafers, F ;

Zuev, SY .

CENTRAL EUROPEAN JOURNAL OF PHYSICS, 2003, 1 (01) :191-209

[2] Particulars of studying the roughness of substrates for multilayer X-ray optics using small-angle X-ray reflectometry, atomic-force, and interference microscopy [J].

Barysheva M.M. ;

Vainer Y.A. ;

Gribkov B.A. ;

Zorina M.V. ;

Pestov A.E. ;

Rogachev D.N. ;

Salashchenko N.N. ;

Chkhalo N.I. .

Bulletin of the Russian Academy of Sciences: Physics, 2011, 75 (1) :67-72

[3] Reflection of atto- and femtosecond X-ray pulses from aperiodic multilayer mirror [J].

Beigman, IL ;

Pirozhkov, AS ;

Ragozin, EN .

JETP LETTERS, 2001, 74 (03) :149-153

[4] Mo/Si multilayers with different barrier layers for applications as extreme ultraviolet mirrors [J].

Braun, S ;

Mai, H ;

Moss, M ;

Scholz, R ;

Leson, A .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (6B) :4074-4081

[5] Effect of roughness, deterministic and random errors in film thickness on the reflecting properties of aperiodic mirrors for the EUV range [J].

Gaikovich, P. K. ;

Polkovnikov, V. N. ;

Salashchenko, N. N. ;

Chkhalo, N. I. ;

Schaefers, F. ;

Sokolov, A. .

QUANTUM ELECTRONICS, 2016, 46 (05) :406-413

[6] Effect of structural defects of aperiodic multilayer mirrors on the properties of reflected (sub)femtosecond pulses [J].

Garakhin, S. A. ;

Meltchakov, E. N. ;

Polkovnikov, V. N. ;

Salashchenko, N. N. ;

Chkhalo, N. I. .

QUANTUM ELECTRONICS, 2017, 47 (04) :378-384

[7] Laboratory reflectometer for the investigation of optical elements in a wavelength range of 5-50 nm: description and testing results [J].

Garakhin, S. A. ;

Zabrodin, I. G. ;

Zuev, S. E. ;

Kas'kov, I. A. ;

Lopatin, A. Ya. ;

Nechay, A. N. ;

Polkovnikov, V. N. ;

Salashchenko, N. N. ;

Tsybin, N. N. ;

Chkhalo, N. I. ;

Svechnikov, M. V. .

QUANTUM ELECTRONICS, 2017, 47 (04) :385-392

[8] DESIGN OF GRAZING-INCIDENCE MULTILAYER SUPERMIRRORS FOR HARD-X-RAY REFLECTORS [J].

JOENSEN, KD ;

VOUTOV, P ;

SZENTGYORGYI, A ;

ROLL, J ;

GORENSTEIN, P ;

HOGHOJ, P ;

CHRISTENSEN, FE .

APPLIED OPTICS, 1995, 34 (34) :7935-7944

[9] Wideband multilayer mirrors with minimal layer thicknesses variation [J].

Kozhevnikov, I. V. ;

Yakshin, A. E. ;

Bijkerk, F. .

OPTICS EXPRESS, 2015, 23 (07) :9276-9283

[10] Design of X-ray supermirrors [J].

Kozhevnikov, Igor V. ;

Bukreeva, Inna N. ;

Ziegler, Eric .

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2001, 460 (2-3) :424-443

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