Effects of High-Temperature Storage on the Glass Transition Temperature of Epoxy Molding Compound

被引:3
|
作者
Li, Ruifeng [1 ,2 ]
Yang, Daoguo [1 ,2 ]
Zhang, Ping [2 ]
Niu, Fanfan [2 ]
Cai, Miao [2 ]
Zhang, G. Q. [2 ]
机构
[1] Beijing Univ Posts & Telecommun, Sch Automat, 10 Xitucheng Rd, Beijing 100876, Peoples R China
[2] Guilin Univ Elect Technol, Sch Mech & Elect Engn, 1 Jinji Rd, Guilin 541004, Guangxi, Peoples R China
基金
中国国家自然科学基金;
关键词
high-temperature storage; epoxy molding compound; glass transition temperature; microelectronics reliability; RELIABILITY; PREDICTION;
D O I
10.1115/1.4047475
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article describes research on changes of glass transition temperature of electron encapsulated polymer-epoxy molding compound (EMC) after thermal oxidation under high-temperature air storage conditions. The evolutions of glass transition temperature of two EMCs with different compositions (different filling contents) under different temperatures (175, 200, and 225 degrees C) and different aging times (100, 500, and 1500 h) were analyzed by dynamic mechanical analysis (DMA) technology. Research results demonstrated that two glass transition temperatures occurred during thermal aging. These two temperatures were the glass transition temperature of the unaged core material (T-g1) and the glass transition temperature of completely oxidized surface material (T-g2). T-g2 increased continuously with the increase of temperature and the prolonging of the aging time. The filling content could have significantly influenced the aging degree of materials.
引用
收藏
页数:6
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