Accelerated Testing of Radiation-Induced Soft Errors in Solid-State Drives

被引：3

作者：

Mielke, Neal ^{[1
]}

Goodwin, Kodie ^{[1
]}

Harris, Rory ^{[1
]}

Kumar, Arbin ^{[1
]}

Lin, Eric ^{[1
]}

Parekh, Vineet ^{[1
]}

Zhang, Boyang ^{[1
]}

Zweig, Matt ^{[1
]}

机构：

[1] Intel Corp, Folsom, CA 95630 USA

来源：

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 2015年 / 15卷 / 04期

关键词：

Soft errors; single-event upsets; silent data corruption; solid-state drives;

D O I：

10.1109/TDMR.2015.2486762

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Accelerated soft error testing with neutron and proton beams was done on a variety of solid-state drives. Effects included temporary hangs, permanent drive failure, and both detected and silent data corruption. Projected rates for sea-level cosmic rays vary widely from model to model, which is arguably insignificant for some but problematic for others. Design protections for reducing soft error sensitivity are discussed and evaluated for effectiveness. Radiation testing was able to detect silent data corruption at levels 10 000 times lower than can be detected in a conventional reliability demonstration test. We argue that accelerated testing should be a standard part of drive design validation.

引用

页码：552 / 558

页数：7

共 11 条

[1] [Anonymous], 2011, 2011 P ANN RELIABILI
[2] [Anonymous], 2006, Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray- Induced Soft Errors in Semiconductor Devices
[3] Bairavasundaram Lakshmi N., 2008, ACM Transaction on Storage, V4, DOI 10.1145/1416944.1416947
[4] Bairavasundaram LN, 2007, PERF E R SI, V35, P289
[5] Radiation-induced soft errors in advanced semiconductor technologies
Baumann, RC
[J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2005, 5 (03) : 305 - 316
[6] Neutron-Induced Upsets in NAND Floating Gate Memories
Gerardin, Simone
Bagatin, Marta
Ferrario, Alberto
Paccagnella, Alessandro
Visconti, Angelo
Beltrami, Silvia
Andreani, Carla
Gorini, Giuseppe
Frost, Christopher D.
[J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2012, 12 (02) : 437 - 444
[7] Undetected desk errors in RAD arrays
Hafner, J. L.
Deenadhayalan, V.
Belluomini, W.
Rao, K.
[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 2008, 52 (4-5) : 413 - 425
[8] Jahinuzzaman S, 2013, INT RELIAB PHY SYM
[9] Narayan S., 2009, Proceedings of the 4th Annual Workshop on Petascale Data Storage, PDSW'09, P37, DOI DOI 10.1145/1713072.1713083
[10] Riska A, 2009, I S WORKL CHAR PROC, P158, DOI [10.1109/IISWC.2009.5306787, 10.1145/1639562.1639589]

← 1 2 →