Development of MOCVD Technology for Integrated YBCO Layer/Buffer Layer Fabrication for Coated Conductors

被引:11
|
作者
Molodyk, Alexander [1 ]
Novozhilov, Mikhail [1 ]
Bitkowsky, Scott [1 ]
Street, Susan [1 ]
Delaney, Albert [1 ]
Castellani, Louis [1 ]
Ignatiev, Alex [1 ]
机构
[1] Met Oxide Technol Inc MetOx, Houston, TX 77040 USA
关键词
Buffer layers; coated conductors; MOCVD; YBCO; BUFFER LAYERS; FILMS; DEPOSITION;
D O I
10.1109/TASC.2009.2018147
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Chemical deposition of all buffer and YBCO layers is recognized as the most economical approach to coated conductor manufacturing. Metal Oxide Technologies Inc. (MetOx) has been developing a cost-effective technology to deposit all buffer and superconducting layers by MOCVD. High I(c) = 201 A/cm and J(c) = 1.53 MA/cm(2) values are obtained on ORNL RA-BiTS buffers. The best superconducting properties of MetOx YBCO films of J(c) = 3.34 MA/cm(2) and I(c) = 480 A/cm have been achieved on LANL IBAD buffers. MetOx MOCVD coated conductors demonstrate promising I(c) = 137 A/cm and J(c) = 1.10 MA/cm(2) . Good superconducting performance has been demonstrated on several 1 m long YBCO tapes. Pinning enhancement via Y(2)O(3) doping in YBCO has been successfully implemented. Very high MOCVD growth rates of 1.25 mu m/min have been demonstrated producing well-textured superconducting YBCO films.
引用
收藏
页码:3196 / 3199
页数:4
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