Multilayer Optics for High Brightness X-Ray Sources

被引：1
作者：
Graf, J. [1 ]
Wiesmann, J. [1 ]
Michaelsen, C. [1 ]
Oehr, A. [1 ]
Hoffmann, C. [1 ]
机构：
[1] Incoatec GmbH, D-21502 Geesthacht, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2006年 / 62卷
关键词：
X-ray optics; multilayer thin films; single-crystal diffractometry;
D O I：
10.1107/S0108767306098114
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
m35.o05
引用
收藏
页码：S94 / S94
页数：1
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