Resistance Increase of Vacuum Interrupters Due to High-Current Interruptions

被引:0
|
作者
Dullni, E. [1 ]
Gentsch, D. [1 ]
Delachaux, Th. [2 ]
Shang, W. [1 ]
机构
[1] ABB AG PPMV, Oberhausener Str 33, Ratingen, Germany
[2] ABB CHCRC, Baden, Switzerland
关键词
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The resistance of vacuum interrupters can be calculated from the geometry and resistivity of current carrying parts and the additional resistance of the contact points between movable and fixed contacts. Since vacuum interrupter contacts are designed as flat contacts facing each other, the resistance is mainly determined by contact force, hardness and resistivity of the contact material. It is known that the contact material changes consistency and structure during short-circuit interruptions within melting depth. Indeed, the overall resistance of a vacuum interrupter has been observed to increase by up to 50% after short-circuit making and breaking tests. Since the resistance increase across the switching device is considered by IEC and IEEE standards as one of the acceptance criteria for the integrity of the interrupter after tests, it is essential to understand the origin of this increase. Different causes are discussed, among them the change of grain structure, increasing resistivity and hardness, and change in material composition. Also, it is investigated whether the resistance increase can be affected, for example, by the flow of continuous current over the closed contacts.
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页码:405 / 408
页数:4
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