Integrated diagnostics for embedded memory built-in self test on PowerPC(TM) devices

被引：6

作者：

Hunter, C

机构：

来源：

INTERNATIONAL CONFERENCE ON COMPUTER DESIGN - VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS | 1997年

关键词：

D O I：

10.1109/ICCD.1997.628920

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Integration of Diagnostics with a Memory Built-in Self-Test (BIST) allowing both an effective and efficient manufacturing test as well as an effective diagnostic capability is detailed. Detection of failures within a memory are the primary objective of an Embedded Memory BIST. Inclusion of comprehensive diagnostics, to isolate faults incurred during the manufacturing or design process, are an extension to the Memory BIST, further utilizing the existing circuitry and functionality Detection and diagnosis of failures within an embedded memory can be realized throughout the entire manufacturing process.

引用

页码：549 / 554

页数：6