A tailored non-linear fluctuation smoothing rule for semiconductor manufacturing factory scheduling

被引:21
作者
Chen, T. [1 ]
机构
[1] Feng Chia Univ, Dept Ind & Management Syst Engn, Seatwen, Taiwan
关键词
scheduling; fluctuation smoothing; non-linear; tailored; remaining cycle time; simulation; semiconductor manufacturing; WAFER FABRICATION; CYCLE-TIME; CONSTRAINTS;
D O I
10.1243/09596518JSCE625
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
A tailored non-linear fluctuation smoothing rule is proposed in this study to improve the performance of scheduling jobs in a semiconductor manufacturing factory. The tailored non-linear fluctuation smoothing rule is modified from the well-known fluctuation smoothing rules with three innovative treatments. At first, the fluctuation in the remaining cycle time estimate is smoothed and then its influence is balanced with that of the release time or the mean release rate. Subsequently, the difference in the slack is magnified by applying the 'division' operator instead. Thirdly, the content of the non-linear fluctuation smoothing rule can be tailored to the semiconductor manufacturing factory to be scheduled. In order to evaluate the effectiveness of the proposed methodology, production simulation is also applied in this study to generate some test data. According to experimental results, the proposed methodology out-performed nine existing approaches in reducing the cycle time averages and standard deviations. In addition, the tailored non-linear scheduling rule was also shown to be a Pareto optimal solution for scheduling jobs in a semiconductor manufacturing factory.
引用
收藏
页码:149 / 160
页数:12
相关论文
共 14 条
[1]   The impact of priority rule combinations on lateness and tardiness [J].
Barman, S .
IIE TRANSACTIONS, 1998, 30 (05) :495-504
[3]   Scheduling semiconductor wafer fabrication by using ordinal optimization-based simulation [J].
Hsieh, BW ;
Chen, CH ;
Chang, SC .
IEEE TRANSACTIONS ON ROBOTICS AND AUTOMATION, 2001, 17 (05) :599-608
[4]   Production-flow-value-based job dispatching method for semiconductor manufacturing [J].
Hsieh, Suhua ;
Hou, Kai-Chung .
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2006, 30 (7-8) :727-737
[5]  
Hung Y.-F., 2001, P 5 ANN INT C IND EN
[6]   Using data mining to find patterns in genetic algorithm solutions to a job shop schedule [J].
Koonce, DA ;
Tsai, SC .
COMPUTERS & INDUSTRIAL ENGINEERING, 2000, 38 (03) :361-374
[7]   Discovering dispatching rules using data mining [J].
Li, XN ;
Olafsson, S .
JOURNAL OF SCHEDULING, 2005, 8 (06) :515-527
[8]   EFFICIENT SCHEDULING POLICIES TO REDUCE MEAN AND VARIANCE OF CYCLE-TIME IN SEMICONDUCTOR MANUFACTURING PLANTS [J].
LU, SCH ;
RAMASWAMY, D ;
KUMAR, PR .
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1994, 7 (03) :374-388
[9]   Development of a state-dependent dispatch rule using theory of constraints in near-real-world wafer fabrication [J].
Tyan, JC ;
Chen, JC ;
Wang, FK .
PRODUCTION PLANNING & CONTROL, 2002, 13 (03) :253-261
[10]   SCHEDULING SEMICONDUCTOR WAFER FABRICATION [J].
WEIN, LM .
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1988, 1 (03) :115-130