Fatigue damage behavior of a surface-mount electronic package under different cyclic applied loads

被引:4
作者
Ren Huai-Hui [1 ,2 ]
Wang Xi-Shu [2 ]
机构
[1] Longyuan Beijing Wind Power Engn Technol Co Ltd, Beijing 100034, Peoples R China
[2] Tsinghua Univ, Dept Engn Mech, Beijing 100084, Peoples R China
基金
中国国家自然科学基金;
关键词
solder joint; fatigue life; hysteresis energy; SEM in-situ technology; SEM IN-SITU; SOLDER JOINT; CRACK; PROPAGATION; SIMULATION; INITIATION; ALLOY;
D O I
10.1088/1674-1056/23/4/044601
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
This paper studies and compares the effects of pull-pull and 3-point bending cyclic loadings on the mechanical fatigue damage behaviors of a solder joint in a surface-mount electronic package. The comparisons are based on experimental investigations using scanning electron microscopy (SEM) in-situ technology and nonlinear finite element modeling, respectively. The compared results indicate that there are different threshold levels of plastic strain for the initial damage of solder joints under two cyclic applied loads; meanwhile, fatigue crack initiation occurs at different locations, and the accumulation of equivalent plastic strain determines the trend and direction of fatigue crack propagation. In addition, simulation results of the fatigue damage process of solder joints considering a constitutive model of damage initiation criteria for ductile materials and damage evolution based on accumulating inelastic hysteresis energy are identical to the experimental results. The actual fatigue life of the solder joint is almost the same and demonstrates that the FE modeling used in this study can provide an accurate prediction of solder joint fatigue failure.
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页数:8
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