Cross-sectional time-resolved high-resolution transmission electron microscopy of atomic-scale contact and noncontact-type scannings on gold surfaces

被引：113

作者：

Kizuka, T ^{[1
]}

Yamada, K ^{[1
]}

Deguchi, S ^{[1
]}

Naruse, M ^{[1
]}

Tanaka, N ^{[1
]}

机构：

[1] JEOL LTD, AKISHIMA, TOKYO 196, JAPAN

来源：

PHYSICAL REVIEW B | 1997年 / 55卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.55.R7398

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Atomic-scale contact and noncontact scannings on gold surfaces were performed by gold tips in time-resolved high-resolution transmission electron microscopy (HRTEM) using a piezodriven specimen holder. The structural variations of atomic arrangements in the scanning process were observed in situ with a time resolution of 1/60 s. Possibility of combination-type microscopy of HRTEM and scanning-probe microscopy was shown. Mechanical processing at one atomic-layer scale was demonstrated.

引用

收藏

页码：R7398 / R7401

页数：4

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