Low cost network analyzer using a six-port reflectometer

被引：0

作者：

de Sousa, FR ^{[1
]}

Huyart, B ^{[1
]}

Freire, RCS ^{[1
]}

机构：

[1] ENST, Paris, France

来源：

IMOC 2001: PROCEEDINGS OF THE 2001 SBMO/IEEE MTT-S INTERNATIONAL MICROWAVE AND OPTOELECTRONICS CONFERENCE: THE CHALLENGE OF THE NEW MILLENIUM: TECHNOLOGICAL DEVELOPMENT WITH ENVIRONMENTAL CONSCIOUSNESS | 2001年

关键词：

six-port reflectometers; direct phase detection;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a simple system for measurement of complex ratio between two RF signals that can be applied to measurement of reflection coefficient of a network port or exhibit the constellation diagram of phase-modulated signals. The system is based on a six-port reflectometer and digital signal processing.

引用

收藏

页码：145 / 147

页数：3

相关论文

共 9 条

[1] CHARACTERIZATION OF DIODE DETECTORS USED IN 6-PORT REFLECTOMETERS [J].

BERGEAULT, E ;

HUYART, B ;

GENEVES, G ;

JALLET, L .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1991, 40 (06) :1041-1043

[2] THRU-REFLECT-LINE - IMPROVED TECHNIQUE FOR CALIBRATING THE DUAL 6-PORT AUTOMATIC NETWORK ANALYZER [J].

ENGEN, GF ;

HOER, CA .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1979, 27 (12) :987-993

[3] 6-PORT REFLECTOMETER - ALTERNATIVE NETWORK ANALYZER [J].

ENGEN, GF .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1977, 25 (12) :1075-1080

[4]

HANSSON ERB, 1983, IEEE T MICROWAVE THE, V31

[5] 6-PORT COUPLER - NEW APPROACH TO MEASURING VOLTAGE, CURRENT, POWER, IMPEDANCE, AND PHASE [J].

HOER, CA .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1972, IM21 (04) :466-&

[6] USING AN ARBITRARY 6-PORT JUNCTION TO MEASURE COMPLEX VOLTAGE RATIOS [J].

HOER, CA ;

ROE, KC .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1975, 23 (12) :978-984

[7] I/Q-channel regeneration in 5-port junction based direct receivers [J].

Huang, XP ;

Hindson, D ;

de Léséleuc, M ;

Caron, M .

1999 IEEE MTT-S SYMPOSIUM ON TECHNOLOGIES FOR WIRELESS APPLICATIONS DIGEST, 1999, :169-173

[8]

WIEDMAN F, 1998, IEEE T INSTRUMENTATI, V2, P527

[9] A new robust method for six-port reflectometer calibration [J].

Wiedmann, F ;

Huyart, B ;

Bergeault, E ;

Jallet, L .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1999, 48 (05) :927-931